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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| ED, SDM, CPM | 2024-05-24 15:50 |
Hokkaido | (Primary: On-site, Secondary: Online) |
Improvement of Sensitivity for Power Cycle Degradation by A New Device Structure Koki Okame, Yuki Yamakita, Shin-ichi Nishizawa, Wataru Saito (Kyushu Univ) |
(To be available after the conference date) [more] | |
| RCS | 2022-04-21 14:05 |
Osaka | Osaka University, and online (Primary: On-site, Secondary: Online) |
A Study on High-reliability Communication Platform using Public Mobile Networks for Railway Applications Masanori Ishino, Taku Suzuki, Yuichi Igarashi, Taishi Oomi, Kenzaburo Fujishima (Hitachi), Kazuki Nakamura, Takayasu Kitano (RTRI)  RCS2022-1 |
Railway operators need to introduce DX applications that improve operational efficiency and need to reduce train operati... [more] | RCS2022-1 pp.1-6 |
| SP, IPSJ-SLP, IPSJ-MUS | 2021-06-18 15:00 |
Online | Online | Speech Intelligibility Experiments using crowdsourcing
-- from designing Web page to Data screening -- Ayako Yamamoto, Toshio Irino (Wakayama Univ.), Kenichi Arai, Shoko Araki, Atsunori Ogawa, Keisuke Kinoshita, Tomohiro Nakatani (NTT) SP2021-5 |
Many subjective experiments have been performed to develop objective speech intelligibility measures, but the novel coro... [more] | SP2021-5 pp.25-30 |
| EA, US, SP, SIP, IPSJ-SLP [detail] | 2021-03-03 14:05 |
Online | Online | [Poster Presentation]
Comparison of speech intelligibility results between laboratory and crowd-sourcing experiments Ayako Yamamoto, Toshio Irino (Wakayama Univ.), Kenichi Arai, Shoko Araki, Atunori Ogawa, Keisuke Kinoshita, Tomohiro Nakatani (NTT) EA2020-73 SIP2020-104 SP2020-38 |
Many subjective experiments have been performed to develop objective speech intelligibility measure. But COVID-19 has ma... [more] | EA2020-73 SIP2020-104 SP2020-38 pp.79-84 |
| EMD, R | 2021-02-12 15:00 |
Online | Online | [Invited Talk]
Reliability physics issues for electronic devices
-- Failure mechanisms that still need to be physically clarified -- Yasushi Kadota (RICOH Co.,Ltd.) R2020-37 EMD2020-28 |
Many kind of electronic devices, including semiconductor devices, have been using in various fields and applications in ... [more] | R2020-37 EMD2020-28 pp.19-24 |
| R | 2020-12-11 14:50 |
Online | Online | Long-term Software Fault Prediction with Wavelet Shrinkage Estimation Jingchi Wu Hu, Tadashi Dohi, Hiroyuki Okamura (Hiroshima Univ.) R2020-32 |
Recently, wavelet shrinkage estimation received considerable attentions to estimate stochastic processes such as a non-h... [more] | R2020-32 pp.12-17 |
| DC | 2019-12-20 16:30 |
Wakayama | Aging Observation using On-Chip Delay Measurement in Long-term Reliability Test Yousuke Miyake, Takaaki Kato, Seiji Kajihara (Kyutech), Masao Aso, Haruji Futami, Satoshi Matsunaga (Syswave), Yukiya Miura (TMU) DC2019-85 |
Avoidance of delay-related faults due to aging phenomena is an important issue of VLSI systems. Periodical delay measure... [more] | DC2019-85 pp.37-42 |
|
| R | 2019-10-25 14:00 |
Nagasaki | Fukue Culture Center | Multiple Change-Point Modeling for Software Reliability Assessment Shinji Inoue (Kansai Univ.), Shigeru Yamada (Tottori Univ.) R2019-38 |
We discuss Markovian imperfect debugging modeling for software reliability assessment with multiple changes of testing e... [more] | R2019-38 pp.1-6 |
| OFT | 2019-05-17 10:45 |
Osaka | Ｉ-site NANBA | 20-year reliability test results for SC optical connectors on outside plant Yoshiteru Abe, Kota Shikama, Kazunori Katayama (NTT) OFT2019-22 |
Optical connectors are currently used in both indoor environments such as buildings and in outdoor equipment such as aer... [more] | OFT2019-22 pp.93-96 |
| EMD, R | 2019-02-15 14:55 |
Osaka | [Invited Talk]
SPICE based circuit performance degradation simulation with MOSFET aging models Koji Tanaka, Shinichiro Amemiya, Hitoshi Okamura, Masanori Shimasue (MoDeCH) R2018-56 EMD2018-57 |
Now, semiconductor products are used in many high reliability products such as vehicle parts and medical equipment. Natu... [more] | R2018-56 EMD2018-57 pp.25-30 |
|
| R | 2018-10-26 14:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A Note on Goodness-of-fit Tests for Software Reliability Models Hiroyuki Okamura, Daisuke Sumida, Tadashi Dohi (Hiroshima Univ.) R2018-34 |
Software reliability models (SRMs) are the stochastic processes of the number of faults detected in the development phas... [more] | R2018-34 pp.1-6 |
| OCS, OFT, LSJ (Joint) [detail] |
2018-08-31 09:30 |
Hokkaido | Hakodate Hokuyo Building 8Kai Hall | Small Footprint Air-gap Multi Fiber Connector Hajime Arao, Sho Yakabe, Fumiya Uehara, Dai Sasaki, Takayuki Shimazu (SEI) OCS2018-25 |
Commonly used optical connectors realize good characteristics by using a PC connection technology. However PC connection... [more] | OCS2018-25 pp.37-42 |
| EMD | 2018-06-15 15:05 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Effect of circuit conditions on various characteristics such as molten metal bridge and arc discharge of auxiliary contact for electromagnetic contactor Kiyoshi Yoshida, Koichiro Sawa (NIT), Kenji Suzuki (Fuji Electric FA Components & Systems) EMD2018-11 |
We have carried out an open and close operation experiments to evaluate the contact reliability of the auxiliary contact... [more] | EMD2018-11 pp.19-23 |
| EMD | 2018-03-02 13:20 |
Saitama | Nippon Institute of Technology | An experiment on reliability of Auxiliary Contacts in Electromagnetic Contactor Sora Ishiwa, Kazuki Takahashi, Koichiro Sawa, Kiyoshi Yoshida (NIT) EMD2017-58 |
We have carried out an open and close operation experiments to evaluate the contact reliability of the auxiliary contact... [more] | EMD2017-58 pp.5-8 |
| DC | 2018-02-20 16:10 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Testing the Bridge Interconnect Fault for Memory based Reconfigurable Logic Device (MRLD) Senling Wang, Tatsuya Ogawa, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Masayuki Sato, Mitsunori Katsu (TRL), Shoichi Sekiguchi (TAIYOYUDEN) DC2017-87 |
MRLD is a promising alternative to FPGA with the benefits of low production cost, low power and small delay. In order to... [more] | DC2017-87 pp.61-66 |
| OPE | 2017-12-08 10:40 |
Okinawa | [Invited Talk]
Reliability of optical connection technology Kota Shikama, Atsushi Aratake (NTT) OPE2017-112 |
Passive optical devices such as optical connectors and optical splitters need to offer long-term reliability even under ... [more] | OPE2017-112 pp.115-119 |
|
| R | 2017-11-16 15:30 |
Osaka | Effects on Stresses in HALT Raphael Pihet, Takuya Hirata, Hideki Kawai, Aoki Yuichi (ESPEC) R2017-53 |
HALT (Highly Accelerated Limit Test) is an accelerated test which, by applying severe stresses, can identify the relativ... [more] | R2017-53 pp.13-16 |
|
| AP | 2017-08-24 13:00 |
Hokkaido | National Institute of Technology, Hakodate College | Stripline-Fed Patch Antenna with Long-Term Reliable Conductive Vias Koh Hashimoto, Makoto Higaki (Toshiba) AP2017-73 |
In stripline-fed patch antennas built in multilayer substrate, the long-term reliability of through-holes used for suppr... [more] | AP2017-73 pp.29-34 |
| R | 2017-05-26 12:30 |
Okayama | Purity Makibi | Markovian Modeling for Software Reliability Assessment with Change-Point Shinji Inoue (Kansai Univ.), Shigeru Yamada (Tottori Univ.) R2017-1 |
We discuss Markovian software reliability modeling with the effect of change-point and imperfect debugging environment f... [more] | R2017-1 pp.1-6 |
| NS, IN (Joint) |
2017-03-03 13:20 |
Okinawa | OKINAWA ZANPAMISAKI ROYAL HOTEL | On Path Selection Considering Length and Reliability for Automatic Evacuation Guiding Based on Interactions between Evacuees and Their Mobile Nodes Takanori Hara, Masahiro Sasabe, Shoji Kasahara (NAIST) NS2016-247 |
When disasters occur, evacuees have to evacuate to safe place quickly. To tackle this problem, there has been proposed a... [more] | NS2016-247 pp.517-522 |
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