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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC, CPSY |
2013-04-26 15:50 |
Tokyo |
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Aumenting a Test Suite for Parameter Value Weighting Satoshi Fujimoto, Hideharu Kojima, Tatsuhiro Tsuchiya (Osaka Univ.) CPSY2013-6 DC2013-6 |
In this paper, we propose a weighting method for pair-wise testing.
Pair-wise testing is a software testing strategy t... [more] |
CPSY2013-6 DC2013-6 pp.31-36 |
SS |
2009-03-02 14:00 |
Saga |
Saga University |
Improving Pairwise Testing Using the Properties of the System under Test Kentaro Hideshima, Tatsuhiro Tsuchiya, Tohru Kikuno (Osaka Univ.) SS2008-48 |
A testing process takes a large part of the whole software development process, and thus testing methods are required th... [more] |
SS2008-48 pp.1-6 |
DE, DC |
2007-10-16 11:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg |
Designing Pairwise Testsets that Optimize Executing Cost Shin Kimoto, Tatsuhiro Tsuchiya, Tohru Kikuno (Osaka Univ.) DE2007-123 DC2007-20 |
Pairwise testing is a software testing strategy that aims to reduce
the cost of testing. This strategy requires that a... [more] |
DE2007-123 DC2007-20 pp.47-50 |
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