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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2022-10-19
16:30		 Online Online [Invited Talk] Reliability improvement of SiC MOSFET by high-temperature CO2 annealing
Takuji Hosoi (Kwansei Gakuin Univ.), Takayoshi Shimura, Heiji Watanabe (Osaka Univ.) SDM2022-62		 Threshold voltage instability is one of the reliability concerns for SiC MOSFETs. NO post-oxidation annealing (NO-POA) i... [more] SDM2022-62
pp.34-37
R 2020-11-30
14:55		 Online Online Analysis for Degraded MLCC Using Voltage Contrast Method in SEM
Akira Saito (Murata) R2020-27		 To ensure the reliability of multi-layer ceramic capacitor (MLCC) while its miniaturization is accelerating, it is neces... [more] R2020-27
pp.21-24
ED, CPM, SDM 2015-05-29
09:30		 Aichi Venture Business Laboratory, Toyohashi University of Technology Crystal Structure and Oxygen Permeation Properties of Oxygen Permeable SrFeO3-δ
Isao Kagomiya, Shiro Shirakawa, Ken-ichi Kakimoto (NITech) ED2015-29 CPM2015-14 SDM2015-31		 We investigated the oxygen permeability and the crystal structure of the SrFeO3-δ(δ= ～0.25)which possesses crystal aniso... [more] ED2015-29 CPM2015-14 SDM2015-31
pp.67-69
ED, OME 2007-09-21
11:25		 Fukuoka Kyushu Institute of Technology The growth mechanism of low-resistivity ITO films onto the glass substrates by a hot-cathode plasma sputtering method
Akihiko Kono, Fumiya Shoji (Kyushu Kyoritsu Univ.) ED2007-148 OME2007-35		 Tin-doped indium oxide (ITO) films fabricated on glass substrates using a hot-cathode plasma sputtering method exhibited... [more] ED2007-148 OME2007-35
pp.25-30
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