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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, RECONF, ICD, IPSJ-SLDM
(Joint) [detail]		 2020-11-18
14:25		 Online Online On-chip power supply noise monitoring for evaluation of multi-chip board power delivery networks
Daichi Nakagawa, Kazuki Yasuda, Masaru Mashiba, Kazuki Monta, Takaaki Okidono, Takuji Miki, Makoto Nagata (Kobe Univ) VLD2020-31 ICD2020-51 DC2020-51 RECONF2020-50		 In these days, information and communication technology has been evolving more and more, and hardware security has been ... [more] VLD2020-31 ICD2020-51 DC2020-51 RECONF2020-50
pp.115-117
EMCJ, IEE-EMC 2014-06-20
10:35		 Hyogo Kobe Univ. Side-Channel Leakage on Silicon Substrate of CMOS Cryptographic Chip
Daisuke Fujimoto, Noriyuki Miura, Makoto Nagata (Kobe Univ.), Yu-ichi Hayashi, Naofumi Homma (Tohoku Univ.), Shivam Bhasin, Jean-Luc Danger (Telecom Paristech) EMCJ2014-10		 Power supply currents of CMOS digital circuits partly flow through a silicon substrate in their returning (ground) paths... [more] EMCJ2014-10
pp.1-6
IPSJ-SLDM, CPSY, RECONF, VLD [detail] 2014-01-29
15:40		 Kanagawa Hiyoshi Campus, Keio University Methodology for NBTI measurement using an on-chip leakage monitor circuit
Takaaki Sato, Kimiyoshi Usami (Shibaura Inst. of Tech.) VLD2013-131 CPSY2013-102 RECONF2013-85		 Miniaturization in recent years ,LSI's aging has become prominent as a factor that prevents the normal operation.By meas... [more] VLD2013-131 CPSY2013-102 RECONF2013-85
pp.173-178
CPSY, VLD, RECONF, IPSJ-SLDM [detail] 2013-01-16
16:00		 Kanagawa   Break Even Time Evaluation of Run-Time Power Gating Control by On-chip Leakage Monitor
Kensaku Matsunaga, Masaru Kudo (SIT), Yuya Ohta, Nao Konishi (SIT), Hideharu Amano (KU), Ryuichi Sakamoto, Mitaro Namiki (TUAT), Kimiyoshi Usami (SIT) VLD2012-118 CPSY2012-67 RECONF2012-72		 Run-time Power Gating (RTPG) reduces leakage energy by turning off a power switch(PS) for idle periods of a circuit duri... [more] VLD2012-118 CPSY2012-67 RECONF2012-72
pp.63-68
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