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 Results 1 - 11 of 11  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD, ITE-IST 2013-07-05
17:15		 Hokkaido San Refre Hakodate Equivalent circuit representation of silicon substrate coupling of active RF components
Naoya Azuma, Makoto Nagata (Kobe univ.) ICD2013-44		 Substrate coupling of radio frequency (RF) active components is represented by equivalent circuits unifying a resistive ... [more] ICD2013-44
pp.125-128
EMCJ 2013-01-11
14:45		 Nagasaki Nagasaki Univ. Reduction technique for power supply noise of Analog-Digital Mixed Circuit Boards -- Adjustment of Attached Resistor Method --
Shunsuke Baba, Shinichi Sasaki, Hitoshi Takakura, Hiroaki Matsumoto (Saga Univ) EMCJ2012-119		 In analog-digital mixed circuit boards , noises from the digital side to the analog side through GND power supply layer ... [more] EMCJ2012-119
pp.99-103
ICD, ITE-IST 2012-07-26
14:20		 Yamagata Yamagata University [Invited Talk] Smart Power LSI Technology Development -- High Performance and High Reliability BiC-DMOS Device Development --
Kenichi Hatasako, Tetsuya Nitta, Masami Hane, Shigeto Maegawa (Renesas Electronics Co.) ICD2012-23		 This paper presents high performance and high reliability BiC-DMOS device development, which act as the driving force de... [more] ICD2012-23
pp.25-29
ICD, ITE-IST 2011-07-22
10:25		 Hiroshima Hiroshima Institute of Technology Analysis Methods of Substrate Sensitivity in an Analog Circiut
Satoshi Takaya, Yoji Bando (Kobe Univ.), Toru Ohkawa, Masaaki Souda, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete), Makoto Nagata (Kobe Univ.) ICD2011-28		 Substrate noise sensitivity of an analog circuit consists of the sensitivity of a device and noise propagation from the ... [more] ICD2011-28
pp.73-78
ICD, ITE-IST 2011-07-22
10:50		 Hiroshima Hiroshima Institute of Technology A Diagnosis Testbench of Analog IP Cores Against On-Chip Environmental Disturbances
Yuuki Araga, Takushi Hashida, Shinichiro Ueyama, Makoto Nagata (Kobe Univ.) ICD2011-29		 Analog IP cores exhibit a multivariate response to dynamic variations of an operation environment,
that are typically r... [more]		 ICD2011-29
pp.79-84
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2010-11-29
11:20		 Fukuoka Kyushu University A Consideration of Substrate Noise Sensitivity of Analog Elements
Satoshi Takaya, Yoji Bando, Takashi Hasegawa (Kobe Univ.), Toru Ohkawa, Masaaki Souda, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete), Makoto Nagata (Kobe Univ.) CPM2010-126 ICD2010-85		 Measure substrate sensitivity of differential amplifiers in a 90 nm CMOS technology with more than 32 different geometor... [more] CPM2010-126 ICD2010-85
pp.13-17
CAS 2010-01-28
16:35		 Kyoto Kyoudai-Kaikan Bldg. [Fellow Memorial Lecture] Study on video-frequency AD converter
Masao Hotta (Tokyo City Univ.) CAS2009-71		 Analog-to-Digital converters (ADCs) for video applications have made exciting progress in miniaturization and power redu... [more] CAS2009-71
pp.43-48
ICD 2009-12-14
13:30		 Shizuoka Shizuoka University (Hamamatsu) [Poster Presentation] Simulation of Substrate Noise Impact on CMOS Analog Circuit
Satoshi Takaya, Yoji Bando, Makoto Nagata (Kobe Univ.) ICD2009-81		 We have measured and simulated substrate noise impact on basic analog amplifier using 90-nm CMOS test chip. To measure s... [more] ICD2009-81
pp.31-34
ICD 2008-12-11
13:30		 Tokyo Tokyo Inst. Tech., Ohokayama Campus, Kokusa-Kouryu-Kaikan [Poster Presentation] Evaluation of algorithms for waveform acquisition in on-chip multi-channel monitoring
Yuuki Araga, Takushi Hashida, Makoto Nagata (Kobe Univ.) ICD2008-108		 Multi-channel waveform monitoring system for large-scale SoCs.
The system consists of probing front end circuits and a ... [more]		 ICD2008-108
pp.39-42
ICD, ITE-IST 2008-10-24
09:20		 Hokkaido Hokkaido University Evaluation of algorithms for waveform acquisition in on-chip multi-channel monitoring
Yuuki Araga, Takushi Hashida, Makoto Nagata (Kobe Univ.) ICD2008-80		 Multi-channel waveform monitoring system for large-scale SoCs.
The system consists of probing front end circuits and a... [more]		 ICD2008-80
pp.125-130
ICD, ITE-IST 2006-07-27
12:00		 Shizuoka   A Signal Measurement System using On-Chip Multi-Channel Waveforme Monitor
Takushi Hashida, Koichiro Noguchi, Makoto Nagata (Kobe Univ.) 		This paper describes measurement system consisted of a FPGA board and
on-chip multi-channel waveforme monitor circuits,... [more]		 ICD2006-64
pp.23-28
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