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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 9 of 9  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2020-12-11
13:00
Hyogo
(Primary: On-site, Secondary: Online)
A Degradation Prediction of Circuit Delay Using A Gradient Descent Method
Seiichirou Mori, Masayuki Gondou, Yousuke Miyake, Takaaki Kato, Seiji Kajihara (Kyutech) DC2020-59
As the risk of aging-induced faults of VLSIs is increasing, highly reliable systems require to predict when the aging-in... [more] DC2020-59
pp.1-6
DC 2019-12-20
16:30
Wakayama   Aging Observation using On-Chip Delay Measurement in Long-term Reliability Test
Yousuke Miyake, Takaaki Kato, Seiji Kajihara (Kyutech), Masao Aso, Haruji Futami, Satoshi Matsunaga (Syswave), Yukiya Miura (TMU) DC2019-85
Avoidance of delay-related faults due to aging phenomena is an important issue of VLSI systems. Periodical delay measure... [more] DC2019-85
pp.37-42
PRMU, IPSJ-CVIM, MVE [detail] 2017-01-19
18:35
Kyoto   Reliability Evaluation of R-R Interval Measurement Status using the Electric Potential Characteristics of QRS Complex for Wearable ECG Devices
Kana Eguchi, Ryosuke Aoki, Kazuhiro Yoshida, Tomohiro Yamada (NTT) PRMU2016-140 MVE2016-31
Electrocardiogram (ECG) captured by wearable ECG devices easily contains artifact because of the measurement faults. Sin... [more] PRMU2016-140 MVE2016-31
pp.171-176
OCS, NS, PN
(Joint)
2016-06-23
09:00
Hokkaido Hokkaido University Low Load Flow Quality Measurement for Data Center Network
Tatsuya Fukuda, Yusuke Shinohara, Shinjiro Yagi (NEC) NS2016-29
It is important for data center operators to monitor their network and ensuring that the network work f... [more] NS2016-29
pp.7-12
DC, CPSY 2013-04-26
16:40
Tokyo   On-Chip Delay Measurement Using Adjacent Test Architecture
Kentaroh Katoh (TNCT) CPSY2013-8 DC2013-8
This paper proposes an on-chip delay measurement using adjacent test architecture with TDC (Time to Digital Converter). ... [more] CPSY2013-8 DC2013-8
pp.43-48
OFT 2012-10-26
09:50
Yamaguchi KAIKYO MESSE SHIMONOSEKI Individual Distribution Measurement in 32-branched PON Using Pulsed-Pump-Probe Brillouin Gain Analysis
Hiroshi Takahashi, Xinyu Fan, Fumihiko Ito (NTT) OFT2012-42
A fault location technique for PONs is essential for improving the service reliability of optical fiber networks. OTDR i... [more] OFT2012-42
pp.51-54
OPE, OFT 2012-03-02
10:55
Tokyo   Individual Distribution Measurement in PON Using Pulsed-Pump-Probe Brillouin Gain Analysis
Hiroshi Takahashi, Xinyu Fan, Yusuke Koshikiya, Fumihiko Ito (NTT) OFT2011-76 OPE2011-202
A fault location technique for PONs is essential for improving the service reliability of optical fiber networks. OTDR i... [more] OFT2011-76 OPE2011-202
pp.19-22
DC 2010-02-15
13:20
Tokyo Kikai-Shinko-Kaikan Bldg. Reduction of execution times and areas for delay measurement by subtraction
Toru Tanabe, Hirohisa Minato, Kentaroh Katoh, Kazuteru Namba, Hideo Ito (Chiba Univ.) DC2009-71
Since VLSI is in nanoscase size, high density and high speed in recent years, small-delay defects which change propagati... [more] DC2009-71
pp.39-44
NS, IN 2005-03-03
08:40
Okinawa Okinawa Zanpa-misaki Royal Effectiveness of Address Selection Mechanism for Site Multihoming
Yasunori Noumi, Takeshi Ikenaga (KIT), Yoshiaki Hori (Kyushu Univ.), Yuji Oie (KIT)
A multihomed stub site is a stub site that has two or more connection to the Internet service providers. Multihoming pr... [more] NS2004-212 IN2004-212
pp.73-78
 Results 1 - 9 of 9  /   
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