| IEICE Technical Committee Submission System Conference Schedule |
Online Proceedings [Sign in] Tech. Rep. Archives |
All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| SDM, ICD, ITE-IST [detail] | 2021-08-18 15:35 |
Online | Online | Evaluation of Side-channel Leakage on High-speed Asynchronous Successive Approximation Register AD Converters Ryozo Takahashi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ.)  SDM2021-43 ICD2021-14 |
This paper presents an evaluation of security level on high-speed asynchronous successive approximation register (SAR) a... [more] | SDM2021-43 ICD2021-14 pp.68-71 |
| SDM | 2021-01-28 14:05 |
Online | Online | [Invited Talk]
Secure 3D CMOS Chip Stacks with Backside Buried Metal Power Delivery Networks for Distributed Decoupling Capacitance Kazuki Monta (Kobe Univ.) SDM2020-51 |
In semiconductor integrated circuits, power signal integrity(PSI) and electromagnetic compatibility caused by power supp... [more] | SDM2020-51 pp.8-12 |
| EMCJ, IEE-EMC | 2019-12-13 15:55 |
Aichi | Chukyo University | Monitoring of wide frequency range of electromagnetic fields in a fusion test facility Masahiro Tanaka, Tatsuhiko Uda (NIFS), Wang Jianqing, Osamu Fujiwara (NIT), Yoshitsugu Kamimura (Utsunomiya U.) EMCJ2019-80 |
In the large fusion test facilities, the electromagnetic fields of various frequencies, ELF~RF~EHF, and static high magn... [more] | EMCJ2019-80 pp.31-35 |
| VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-13 15:00 |
Ehime | Ehime Prefecture Gender Equality Center | On-Chip Leakage Monitor based Temperature Sensor Circuit for Ultra Low Voltage Daisuke Sato, Kimiyoshi Usami (SIT) VLD2019-33 DC2019-57 |
The increase in leakage current due to miniaturization is a big problem in devices that require low power consumption. L... [more] | VLD2019-33 DC2019-57 pp.45-50 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2015-12-02 16:20 |
Nagasaki | Nagasaki Kinro Fukushi Kaikan | Sleep Control Using Virtual Ground Voltage Detection For Fine-Grain Power Gating Masaru Kudo, Kimiyoshi Usami (Shibaura Institute of Tech.) VLD2015-57 DC2015-53 |
This paper describes a sleep control technique using leakage monitor circuit to implement Fine-Grain Power Gating (FGPG)... [more] | VLD2015-57 DC2015-53 pp.129-134 |
| RECONF, CPSY, VLD, IPSJ-SLDM [detail] | 2015-01-29 17:00 |
Kanagawa | Hiyoshi Campus, Keio University | Temperature sensor applying Body Bias in Silicon-on-Thin-BOX Tsubasa Kosaka, Shohei Nakamura, Kimiyoshi Usami (S.I.T.) VLD2014-127 CPSY2014-136 RECONF2014-60 |
The performance advancement by the transistor scaling is blocked by increase of power consumption and process variation.... [more] | VLD2014-127 CPSY2014-136 RECONF2014-60 pp.99-104 |
| R | 2014-11-20 13:45 |
Osaka | Prediction of performance degradation and lifetime for semiconductor devices using markov chain model Kai Momoda, Koichi Endo, Yoshihiro Midoh, Katsuyoshi Miura, Koji Nakamae (Osaka Univ.) R2014-61 |
We study on a method to predict performance degradation and lifetime of semiconductor devices under the assumption that ... [more] | R2014-61 pp.1-5 |
|
| OFT | 2014-05-30 11:15 |
Yamagata | Development of Monitoring Sensors for Aging of Radioactive Waste Storage Containers by using CFRP-FBG and for Leakage from it Issei Sasaki (Chitose Inst. of Science and Tech.), Masao Gotou (STJ), Makoto Yamada (Osaka Pref. Univ.) OFT2014-14 |
This report presents optical fiber sensors for extremely long term monitoring of aging and radiation leakage from radioa... [more] | OFT2014-14 pp.65-68 |
|
| VLD | 2014-03-05 13:00 |
Okinawa | Okinawa Seinen Kaikan | Investigation of thermal monitor for applying to Dynamic Voltage Scaling in SOTB Tatsuya Wada, Kimiyoshi Usami (Shibaura Inst. of Tech) VLD2013-160 |
SOTB (Silicon on Thin Buried Oxide) transistors can operate at high speed in the ultra-low voltage. However, variation i... [more] | VLD2013-160 pp.141-146 |
| CPSY, VLD, RECONF, IPSJ-SLDM [detail] | 2013-01-16 16:00 |
Kanagawa | Break Even Time Evaluation of Run-Time Power Gating Control by On-chip Leakage Monitor Kensaku Matsunaga, Masaru Kudo (SIT), Yuya Ohta, Nao Konishi (SIT), Hideharu Amano (KU), Ryuichi Sakamoto, Mitaro Namiki (TUAT), Kimiyoshi Usami (SIT) VLD2012-118 CPSY2012-67 RECONF2012-72 |
Run-time Power Gating (RTPG) reduces leakage energy by turning off a power switch(PS) for idle periods of a circuit duri... [more] | VLD2012-118 CPSY2012-67 RECONF2012-72 pp.63-68 |
|
| ITS, WBS (Joint) |
2011-12-15 11:35 |
Nagasaki | Fundamental Study on In-vehicle Radio Propagation Characteristics at 60GHz Ryohei Nakamura, Akihiro Kajiwara (Kitakyushu Univ.) WBS2011-37 |
In-vehicle wireless communication (IVC) has recently attracted considerable attention in order to advance the amenity an... [more] | WBS2011-37 pp.31-35 |
|
| ISEC, SITE, IPSJ-CSEC | 2008-07-25 15:20 |
Fukuoka | Fukuoka Institute of System LSI Design Industry | A Study on Detecting Information Leak Virus by Activity Monitoring Tetsuro Kito (Hitachi, Ltd.), Takahiro Matsuki, Masaaki Matsuoka (LAC), Hirofumi Nakakoji, Masato Terada (Hitachi, Ltd.) |
In these days, it becomes a serious problem that personal/private information are disclosed by computer viruses which ab... [more] | ISEC2008-60 pp.183-188 |
| VLD, ICD | 2008-03-06 10:05 |
Okinawa | TiRuRu | Design and Analysis of on-chip leakage monitor using MTCMOS Satoshi Koyama, Seidai Takeda, Kimiyoshi Usami (S.I.T.) VLD2007-146 ICD2007-169 |
On cutting-edge semiconductor process, leakage current varies drastically due to process variation and temperature chang... [more] | VLD2007-146 ICD2007-169 pp.13-18 |
[Return to Top Page]