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Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ, IEE-SPC, EMD, PEM
(Joint) [detail]		 2018-07-26
13:10		 Tokyo Kikai-Shinko-Kaikan Bldg. ESD evaluation using Optical E-Field Sensor/Optical Voltage Sensor
Ryuji Osawa (Seikoh Giken) 		For the immunity test by ESD (Electro-Static Discharge),the test method is internationally specified in IEC61000-4-2. Ma... [more]
EMCJ, IEE-EMC 2010-12-10
14:05		 Aichi Chukyo Univ. Toyoda Campus An Immunity Test Method Insensitive to Arrangements of Equipment Under Test for Indirect Discharges of ESD-Gun onto Tapered Vertical Coupling Plane
Takuro Tsuji, Kouji Himeno (NIT), Yoshinori Taka (KNCT), Osamu Fujiwara (NIT) EMCJ2010-92		 International Electrotechnical Commission (IEC) prescribes immunity tests (IEC61000-4-2) of electronic equipment against... [more] EMCJ2010-92
pp.63-67
EMCJ 2008-12-19
15:35		 Gifu Gifu Univ. Uncertainty of Voltage Waveform induced by Indirect Discharge of ESD-gun onto Vertical Coupling Plane
Norio Yamamoto (Industrial Research Center of Shiga Pref.), Yoshinori Taka, Osamu Fujiwara (Nagoya Institute of Technology) EMCJ2008-98		 The International Electro-technical Commission (IEC) prescribes ESD immunity tests (IEC610000-4-2) for electronic equipm... [more] EMCJ2008-98
pp.69-73
EMCJ 2008-03-07
13:15		 Tokyo Kikai-Shinko-Kaikan Bldg Influence of Test Methods for Indirect Discharge of ESD Gun onto Horizontal Coupling Plane
Norio Yamamoto (IRCS) EMCJ2007-123		 The International Electro-technical Commission (IEC) prescribes the ESD immunity test (IEC610000-4-2) for electronic equ... [more] EMCJ2007-123
pp.37-42
 Results 1 - 4 of 4  /   
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