| IEICE Technical Committee Submission System Conference Schedule |
Online Proceedings [Sign in] Tech. Rep. Archives |
All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMCJ, IEE-SPC (Joint) |
2017-06-05 13:55 |
Hokkaido | Sapporo Convention Center | Improved shunt-type AAN and its characteristics Takashi Shinozuka, Katsumi Fujii (NICT), Kazuhiro Takaya, Yoshiharu Akiyama (NTT), Akira Sugiura, Osami Wada (Kyoto Univ.)  EMCJ2017-23 |
(To be available after the conference date) [more] | EMCJ2017-23 pp.13-18 |
| EMCJ, IEE-EMC, IEE-MAG | 2017-05-18 13:35 |
Overseas | Nanyang Technological University | Impact of LISN on EMI Filter Performance Kangrong Li, Kye Yak See (Nanyang Technological University) |
The performance of the electromagnetic interference (EMI) filter is usually evaluated with the presence of the line impe... [more] | |
| EMCJ | 2017-01-19 14:55 |
Fukuoka | Kyushu Institute of Technology | Investigation of ISN type influence to disturbances measurement at telecommunication port by using imitation EUT Daisuke Kawakami, Nobuo Kuwabara (KIT) EMCJ2016-113 |
Shunt type, series type, and asymmetric transformer type ISNs (Impedance stabilization network) have been developed. In ... [more] | EMCJ2016-113 pp.25-30 |
| EMCJ | 2016-05-13 13:20 |
Hokkaido | Hokkaido University | LCL Measurement Method Based on Equivalent Circuit Modeling Tohlu Matsushima (Kyoto Univ.), Kazuhiro Takaya, Yuichiro Okugawa, Ken Okamoto (NTT), Akira Sugiura, Osami Wada (Kyoto Univ.) EMCJ2016-12 |
In order to measure LCL (longitudinal conversion loss) of an equipment under test (EUT) or a circuit with high symmetry,... [more] | EMCJ2016-12 pp.17-22 |
| OME, SDM | 2015-04-30 10:00 |
Okinawa | Oh-hama Nobumoto Memorial Hall | [Invited Talk]
Formation of high Sn content SiSn films and its band structure
-- Aiming for direct-band-gap semiconductor -- Masashi Kurosawa, Wakana Takeuchi, Mitsuo Sakashita, Osamu Nakatsuka, Shigeaki Zaima (Nagoya Univ.) SDM2015-9 OME2015-9 |
This paper reports our recent progress in advanced Sn-assisted low-temperature crystallization methods for Si$_{1-x}$Sn$... [more] | SDM2015-9 OME2015-9 pp.35-37 |
| EMCJ | 2015-03-06 16:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Special Talk]
Outline of the progress relating to establishment and revision of EMC standards for Information Technology Equipment Fujio Amemiya (NTT AT) EMCJ2014-110 |
So many requirements shown in such EMC standards for Information Technology Equipment as CISPR 22 and CISPR 24 have been... [more] | EMCJ2014-110 pp.47-50 |
| EMCJ, PEM (Joint) |
2014-11-14 10:45 |
Tokyo | AIST Tokyo Waterfront | Characterization of a V-type Artificial Mains Network in Terms of the Scattering Parameters Takashi Shinozuka, Katsumi Fujii (NICT), Akira Sugiura, Osami Wada (Kyoto Univ.) EMCJ2014-68 |
Abstract Theoretical and experimental investigations are carried out to characterize the V-type AMN in terms of the S-p... [more] | EMCJ2014-68 pp.7-12 |
| R | 2013-11-14 14:50 |
Osaka | Effect of Plate-Shape Ni-Sn IMC on the Growth Mechanism of Tin Whisker under Thermal Shock Stress Akira Saito, Akira Okamoto, Yoshihiro Iwahori, Makoto Ogawa (Mutrata MFG), Akihiro Motoki (Sabae Mutrata MFG) R2013-76 |
With the promotion of lead-free solder in these years, some segments have expressed concern about the possibility of tin... [more] | R2013-76 pp.11-16 |
|
| IN, IA (Joint) |
2012-12-14 16:10 |
Hiroshima | Hiroshima City Univ. | A study on the relationship between repair time distribution and repair pattern for telecommunication networks Hiroyuki Funakoshi, Kohjun Koshiji (NTT) IN2012-137 |
The authors have been declared that repair-time distribution for telecommunication networks approximates to mixing log-n... [more] | IN2012-137 pp.91-96 |
| EMCJ, IEE-EMC | 2012-06-22 11:20 |
Osaka | Osaka Univ. | Linear Equivalent Circuit Modeling of Power Converter Circuit for Conducted Disturbance Estimation
-- Determination of Model Parameters by Use of Dual Port LISN -- Shuhei Inoue, Kengo Iokibe, Yoshitaka Toyota (Okayama Univ.), Tetsushi Watanabe (Industrial Technology Center of Okayama Prefecture) EMCJ2012-24 |
In this paper, a linear equivalent circuit model on the basis of a EMC macro-model of IC/LSI, LECCS model, is investigat... [more] | EMCJ2012-24 pp.17-22 |
| EMCJ, ITE-BCT | 2012-03-16 13:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Research and Development of Measurement and Testing Technique for Line Impedance Stabilized Network/Artificial Mains Network (LISN/AMN)
-- Establishment of Reliable Measurement System -- Ryoko Kishikawa, Masahiro Horibe, Masaaki Shida (AIST) EMCJ2011-139 |
In recent years, demands of management and regulation for electromagnetic use are increasing due to the wide use of elec... [more] | EMCJ2011-139 pp.55-60 |
| HCS | 2012-01-20 15:45 |
Aichi | Research of Improving University Website's Usability and Accessability Christina Camado Uechi, Tomokazu Nagata, Yuji Taniguchi, Shiro Tamaki (Univ. Ryukyus) HCS2011-62 |
Nongovernment companies has there own way to bring custermers from websites. These techniques are established and used w... [more] | HCS2011-62 pp.47-50 |
|
| ACT (2nd) |
2010-07-09 15:35 |
Tokyo | NICT Kohji-machi Office | Development of RF Impedance Standards for EMC Test Instruments Masahiro Horibe, Masaaki Shida (NMIJ-AIST) |
In EMI receiver and artificial mains network (LISN/AMN), etc. the calibration of the input impedance and the insertion l... [more] | |
| EMCJ, ITE-BCT | 2010-03-12 16:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Special Talk]
Developmenntal Research on Telecom. EMC and International Standardization
-- Background of the limits of common mode disturbance at telecommunication port -- Fujio Amemiya (NTT-AT) EMCJ2009-134 |
Wide introduction of digital, high-speed and broad-band technologies in the field of electronic equipment and/or systems... [more] | EMCJ2009-134 pp.47-52 |
| IN | 2010-02-05 09:45 |
Okinawa | A Study of IP Storage Management using IP Multimedia Subsystem Yoshihiro Nomoto (NTT Corp.), Kai Chen (Shanghai Jiao Tong Univ.) IN2009-134 |
In this report, we suggest a video server system that performs streaming transmissions of consumer generated video (CGV)... [more] | IN2009-134 pp.45-50 |
|
| EMCJ, ITE-BCT | 2009-03-13 11:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Loophole in the Measurement of Conducted Emission from Broadband Power-Line Communications using Impedance Stabilization Network Masahiro Kitagawa (Osaka Univ.) EMCJ2008-115 |
The radiated emission due to the in-house broadband power-line communications (PLC) is caused by the common-mode (CM) cu... [more] | EMCJ2008-115 pp.7-12 |
| EMCJ | 2008-06-20 10:05 |
Hokkaido | Hokkaido Univ. | Outlet LCL does not tell the mode conversions distributed in the power-line network
-- Transmission line theory of common-mode current and LCL -- Masahiro Kitagawa (Osaka Univ.) EMCJ2008-10 |
The radiated emission from the power-line communications (PLC) is mainly caused by the common mode (CM) current converte... [more] | EMCJ2008-10 pp.17-22 |
| SS | 2005-10-14 09:00 |
Saitama | Jumonji University | Detection and Repair of Inconsistency in UML Models using XPath adn XMI-difference Toru Sasaki, Kozo Okano, Shinji Kusumoto (Osaka Univ.) |
In this paper, we propose a method for detection and repair of inconsistency in UML models. The method utilizes conditio... [more] | SS2005-48 pp.1-6 |
| EMCJ | 2005-09-08 15:35 |
Kyoto | Kyoto University | Investigation of Line Impedance Stabilization Network for VHF band used for measuring radiated disturbance Hidenori Muramatsu (NEC AccessTechnica, Ltd.), Masanori Yamaguchi (Fujitsu Institute of Management), Jiro Kawano (VCCI) |
The impedance between the phase line and the metal ground plane of the power supply facility for equipment under test (E... [more] | EMCJ2005-62 pp.19-24 |
| EMCJ | 2005-09-08 16:10 |
Kyoto | Kyoto University | A Study on ISN for Measuring Conductive Disturbance at Communication Port Hiroshi Yamane (NTT), Kunihiro Osabe (VLAC), Jiro Kawano (VCCI) |
As disturbance emitted from information technology equipment (ITE), there are radiated disturbance from apparatus, condu... [more] | EMCJ2005-63 pp.25-29 |
[Return to Top Page]