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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ, MICT
(Joint)
2018-03-16
13:25
Tokyo Kikai-Shinko-Kaikan Bldg. Relation between Voltage Fluctuations of Internal Terminals and Output Terminal of Linear Regulator
Katsumasa Fujiki (Kyoto Univ.), Tohlu Matsushima (Kyutech), Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2017-110
Immunity of voltage regulator when conducted disturbance is applied from supply voltage pin should be evaluated and simu... [more] EMCJ2017-110
pp.31-36
EMCJ 2015-07-09
10:55
Tokyo Kikai-Shinko-Kaikan Bldg. Correlation between Immunity Behavior and Internal Terminal Voltage of LDO Regulator Circuits
Hidetoshi Miyahara, Nobuaki Ikehara, Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2015-33
Predicting undesired behavior of IC caused by conducted electromagnetic disturbances at a design stage of electronic pro... [more] EMCJ2015-33
pp.13-18
EMCJ, IEE-EMC, IEE-MAG 2015-06-26
15:20
Overseas KMITL, Thailand Macro model of LDO voltage regulator for estimation of immunity to conducted disturbance
Tohlu Matsushima, Nobuaki Ikehara, Hidetoshi Miyahara, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2015-30
In this report, an ICIM-CI model, which is discussed in IEC, for evaluation of IC immunity is described. In addition, a ... [more] EMCJ2015-30
pp.73-78
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