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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMCJ, MICT (Joint) |
2018-03-16 13:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Relation between Voltage Fluctuations of Internal Terminals and Output Terminal of Linear Regulator Katsumasa Fujiki (Kyoto Univ.), Tohlu Matsushima (Kyutech), Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2017-110 |
Immunity of voltage regulator when conducted disturbance is applied from supply voltage pin should be evaluated and simu... [more] |
EMCJ2017-110 pp.31-36 |
EMCJ |
2015-07-09 10:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Correlation between Immunity Behavior and Internal Terminal Voltage of LDO Regulator Circuits Hidetoshi Miyahara, Nobuaki Ikehara, Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2015-33 |
Predicting undesired behavior of IC caused by conducted electromagnetic disturbances at a design stage of electronic pro... [more] |
EMCJ2015-33 pp.13-18 |
EMCJ, IEE-EMC, IEE-MAG |
2015-06-26 15:20 |
Overseas |
KMITL, Thailand |
Macro model of LDO voltage regulator for estimation of immunity to conducted disturbance Tohlu Matsushima, Nobuaki Ikehara, Hidetoshi Miyahara, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2015-30 |
In this report, an ICIM-CI model, which is discussed in IEC, for evaluation of IC immunity is described. In addition, a ... [more] |
EMCJ2015-30 pp.73-78 |
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