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Committee Date Time Place Paper Title / Authors Abstract Paper #
MW, ED 2019-01-18
11:05
Tokyo Hitachi, Central Research Lab. Investigation of the Pulsed-IV Degradation Mechanism of GaN-HEMT under High Temperature Storage Tests
Yasunori Tateno (Sumitomo Electric), Yasuyo Kurachi (Sumitomo Electric Device Innovations), Hiroshi Yamamoto, Takashi Nakabayashi (Sumitomo Electric) ED2018-82 MW2018-149
The purpose of this study is to investigate the physical mechanism of pulsed-IV degradation under high temperature stora... [more] ED2018-82 MW2018-149
pp.71-74
EMD, R 2009-02-20
13:45
Mie Sumitomo Wiring Systems LTD., Head Office Pull strength analysis of Pb free solder at a connected point
Taku Hashiguchi, Yuta Nasukawa, Kazunori Hiraoka (Salesian Polytecn.) R2008-51 EMD2008-127
Pull strength of Pb free solder at a connected point is tested and analyzed.
Experiments are performed with various p... [more]
R2008-51 EMD2008-127
pp.43-48
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