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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2018-02-20 15:05 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A method for improving an estimation accuracy of a specific temperature and voltage range in a digital temperature and voltage sensor Kenji Inoue, Yousuke Miyake, Seiji Kajihara (Kyutech) DC2017-85 |
An RO(Ring Oscillator)-based digital temperature and voltage sensor has been proposed in order to measure an on-chip tem... [more] |
DC2017-85 pp.49-54 |
CPSY, DC, IPSJ-ARC (Joint) [detail] |
2017-07-26 16:15 |
Akita |
Akita Atorion-Building (Akita) |
A Two-Temperature-Point Calibration Method for A Digital Temperature And Voltage Sensor Yousuke Miyake, Yasuo Sato, Seiji kajihara (KIT) DC2017-19 |
A measurement method of a digital sensor using ring oscillators to measure a temperature and a voltage of a VLSI was pro... [more] |
DC2017-19 pp.19-24 |
DC |
2015-12-18 13:20 |
Niigata |
Kurieito Mulakami (Murakami City) |
On Measurement of On-Chip Temperature And Voltage Variation Using A Digital Monitor Yousuke Miyake, Takaaki Kato, Takuya Itonaga, Yasuo Sato, Seiji Kajihara (KIT) DC2015-74 |
A digital monitor for measuring a temperature and a voltage of VLSIs is proposed. The monitor can derive measurement res... [more] |
DC2015-74 pp.5-10 |
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