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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 17 of 17  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
MRIS, ITE-MMS 2021-10-08
14:30
Online Online [Invited Talk] First principles calculations and material design of multilayer films with spin-orbit induced magnetic phenomena
Kohji Nakamura, Kenji Nawa (Mie Univ.) MRIS2021-8
Multilayer thin film materials with desired magnetic, electric and optical properties involving spin-orbit coupling inte... [more] MRIS2021-8
pp.11-12
SDM 2020-11-19
14:10
Online Online [Invited Talk] Prediction model of dielectric constants of perovskite-type oxides by first-principles calculations and materials informatics
Yusuke Noda (Kanazawa Gakuin Univ.) SDM2020-25
The aim of this study is to clarify the relationship between the dielectric constants and other physical and chemical pr... [more] SDM2020-25
pp.15-20
OME 2017-12-28
14:30
Tokyo Kikai-Shinko-Kaikan Bldg. Investigation of interactions between Pt atom and carbon supports by a first-principles calculation
Yuta Nakajo (Tokyo Univ. Science), Teruyasu Mizoguchi (The University of Tokyo), Yasuhito Sugano, Masaru Yoshitake, Yumi Tanaka (Tokyo Univ. Science) OME2017-52
To estimate interactions between carbon supports and Pt, which affects the catalytic activity of carbon-supported Pt nan... [more] OME2017-52
pp.15-18
SDM 2017-11-09
10:00
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Multri-Physics Simulation of GaN MOVPE Growth
Kenji Shiraishi, Kazuki Sekiguchi, Kenta Chokawa, Hiroki Shirakawa, Kento Kawakami, Yoshihiro Yamamoto, Masaaki Araidai, Naoya Okamoto, Katsumori Yoshimatsu (Nagoya Univ.), Yoshihiro Kangawa, Koichi Kakimoto (Kyushu Univ.) SDM2017-61
In conventional GaN growth simulations, it has been believed that tri-methyl-gallium (TMG) first react with ammonia form... [more] SDM2017-61
pp.1-4
SDM, EID 2016-12-12
13:30
Nara NAIST First-Principles Calculation Studies of Resistive Switching Mechanism in Polycrystalline Metal Oxide Film
Takumi Moriyama, Sohta Hida (Tottori Univ.), Takahiro Yamasaki, Takahisa Ohno (NIMS), Satoru Kishida, Kentaro Kinoshita (Tottori Univ.) EID2016-18 SDM2016-99
For practical use of Resistive Random Access Memory (ReRAM), clarifying physical properties of conducting path created i... [more] EID2016-18 SDM2016-99
pp.41-44
SDM 2016-11-11
14:30
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Application of DFT Calculation for the Development of High Quality Si and Ge Substrates -- From Ultra Large Diameter Crystal Pulling to Metal Gettering --
Koji Sueoka (Okayama Pref. Univ.) SDM2016-87
During the last decade, considerable progress has been made in understanding the properties and behavior of the vacancy ... [more] SDM2016-87
pp.49-54
SDM, EID 2014-12-12
17:45
Kyoto Kyoto University Study on Formative Mechanism of Conductive Path in Resistive Random Access Memory (ReRAM) -- Analyses of Various NiO Surface States Using Ab Initio Calculations --
Takumi Moriyama (Tottori Univ.), Takahiro Yamasaki, Takahisa Ohno (NIMS), Satoru Kishida, Kentaro Kinoshita (Tottori Univ.) EID2014-39 SDM2014-134
For practical use of Resistive Random Access Memory (ReRAM), clarifying physical properties of conducting path created i... [more] EID2014-39 SDM2014-134
pp.135-138
SDM 2014-11-07
10:50
Tokyo Kikai-Shinko-Kaikan Bldg. Stress and Doping Impact on Intrinsic Point Defect Behaviour in Growing Single Crystal Silicon
Koji Sueoka, Eiji Kamiyama, Kozo Nakamura (Okayama Pref. Univ.), Jan Vanhellemont (Ghent Univ.) SDM2014-104
For the mass-production of 450 mm-diameter defect-free Si crystals, one has to take into account the impact of thermal s... [more] SDM2014-104
pp.47-52
SDM 2014-06-19
10:30
Aichi VBL, Nagoya Univ. Stability of vacancy defect around metal/Ge interfaces; first-principles study
Shogo Sasaki, Takashi Nakayama (Chiba Univ.) SDM2014-46
It is well known that Ge has high density of vacancy defects compared to Si. Vacancy defects often change electronic pro... [more] SDM2014-46
pp.17-20
CPM, ED, SDM 2014-05-28
15:35
Aichi   First-principles simulation on electron-scattering process in magnetoresistive memory
Masaaki Araidai (Nagoya Univ.), Takahiro Yamamoto (Tokyo Univ. of Sci.), Kenji Shiraishi (Nagoya Univ.) ED2014-27 CPM2014-10 SDM2014-25
Magnetoresistance memory is expected as emerging memory device due to the desired functions such as non-volatility, fast... [more] ED2014-27 CPM2014-10 SDM2014-25
pp.47-50
SDM 2013-11-14
13:00
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Role of Computational Sciences in Design of Modern Electron Devices
Kenji Shiraishi (Nagoya Univ.) SDM2013-101
Recent computational science plays important roles in development of new materials and modern electron devices. Among th... [more] SDM2013-101
pp.9-14
SDM 2013-11-14
13:50
Tokyo Kikai-Shinko-Kaikan Bldg. Atomistic Study of Sulfur Diffusion and S2 Formation in Silicon during Low-temperature Rapid Thermal Annealing
Takahisa Kanemura, Koichi Kato, Hiroyoshi Tanimoto, Nobutoshi Aoki, Yoshiaki Toyoshima (Toshiba) SDM2013-102
Sulfur doping at NiSi/Si junction has been found to make a Schottky barrier height ultimately small, revealing almost ze... [more] SDM2013-102
pp.15-20
SDM 2012-06-21
13:35
Aichi VBL, Nagoya Univ. Surface Segregation Behavior of B, Ga, Sb, and As Dopant Atoms on Ge(100) and Ge(111) Examined with a First-principles Method
Fumiya Iijima, Kentaro Sawano (TCU), Jiro Ushio (CRL), Takuya Maruizumi, Yasuhiro Shiraki (TCU) SDM2012-52
To understand surface segregation behaviour of B, Ga, As, and Sb dopant atoms on Ge (100) and Ge (111) surfaces, the pot... [more] SDM2012-52
pp.47-51
SDM 2011-07-04
14:20
Aichi VBL, Nagoya Univ. Schottky-barrier change by structural disorders at metal/Si interfaces: First-principles study
Kyosuke Kobinata, Takashi Nakayama (Chiba Univ.) SDM2011-62
Schottky-barrier changes by the structural disorders are studied using the first-principles calculations and adopting Au... [more] SDM2011-62
pp.69-73
ED, SDM 2010-07-02
15:50
Tokyo Tokyo Inst. of Tech. Ookayama Campus Theoretical Study of the Hydrogen Effect on the Program/Erase Cycle of MONOS-Type Memories
Akira Otake, Keita Yamaguchi, Kenji Shiraishi (Univ. of Tsukuba.) ED2010-100 SDM2010-101
Due to the aggressive scaling of non-volatile memories, “charge-trap memories” such as MONOS type memories are inevitabl... [more] ED2010-100 SDM2010-101
pp.221-224
ED, LQE, CPM 2009-11-19
14:20
Tokushima Univ. of Tokushima (Josanjima Campus, Kogyo-Kaikan) Theoretical Studies on the Characteristic Electronic Structures of In-Containint Nitride Seimiconductors Based of the First Principles Calculations
Kenji Shiraishi, Jun-ichi Iwata (Univ. of Tsukuba/JST), Teruaki Obata (Univ. of Tsukuba), Atsushi Oshiyama (Univ. of Tokyo/JST) ED2009-138 CPM2009-112 LQE2009-117
In-containing nitride semiconductors exhibit characteristic behavior which can be ascribed to the large difference in th... [more] ED2009-138 CPM2009-112 LQE2009-117
pp.47-50
SDM 2009-06-19
10:20
Tokyo An401・402 Inst. Indus. Sci., The Univ. of Tokyo First-Principles Calculations for Interfacial Reaction during Si Oxidation
Toru Akiyama (Mie Univ.), Hiroyuki Kageshima (NTT Corp.), Masashi Uematsu (Keio Univ.), Tomonori Ito (Mie Univ.) SDM2009-28
The interfacial reaction processes during Si oxidation are investigated based on first-principles total-energy electroni... [more] SDM2009-28
pp.9-13
 Results 1 - 17 of 17  /   
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