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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 31  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
R 2023-12-07
16:05
Tokyo Kikai-Shinko-Kaikan Bldg
(Primary: On-site, Secondary: Online)
Formulation of Dependability/Risk-related Measures for Safety-Related Systems conforming to Functional Safety -- Systems with the Faults Detected by Proof-Testing (PT) and Subsequent Corrective Maintenance --
Yoshinobu Sato (Institute of HCI) R2023-54
The part 6 of basic safety standard of IEC 61508 describes the guidelines to estimate the dangerous failure rates (PFH) ... [more] R2023-54
pp.24-29
MSS, SS 2019-01-16
10:50
Okinawa   Design of distribution ratio on a multi-stage parallel production line based on an optimal velocity traffic model
Toru Sano, Keiji Konishi (Osaka Pref. Univ.), Takehiro Itou, Hisaya Wakayama (NEC) MSS2018-70 SS2018-41
Recently, there is a need to implement production systems which can adapt to changing demand. This report proposes a mul... [more] MSS2018-70 SS2018-41
pp.85-90
EMCJ 2018-07-27
15:45
Tokyo Kikai-Shinko-Kaikan Bldg. A study on measuring method of influence of contact force of contact points on signal transmission characteristics
Kenji Aihara (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2018-32
When a contact point of a connector connecting electric devices has poor maintenance or degradation over time, it causes... [more] EMCJ2018-32
pp.61-66
EMD, R 2017-02-17
15:10
Shiga Omuron Kusatsu Factory R2016-66 EMD2016-93 Railway application standards specify four different reliability parameters which are “Reliability”, “Availability”, “Ma... [more] R2016-66 EMD2016-93
pp.37-43
R 2016-12-16
14:40
Kanagawa Maholoba Minds Miura (Miura City, Kanagawa Prefecture) IEC/TR 63039 Newly Published by IEC/TC56 for Probabilistic Risk Analysis
Yoshinobu Sato (JACO) R2016-55
IEC TR 63039 provides the following guides from the perspective of risk analysis: a) defining the essential terms and co... [more] R2016-55
pp.7-12
IE, IMQ, MVE, CQ
(Joint) [detail]
2016-03-08
10:15
Okinawa   Analysis of Failure Frequency Improvement for Telecommunications Networks
Keita Kusanagi, Masahiro Hayashi (Tokyo City Univ.) CQ2015-138
This paper proposes a new index to clarify the percentage of number of failures at each element. We call this index ‘ele... [more] CQ2015-138
pp.171-176
AP
(2nd)
2016-02-29
14:20
Overseas Telecommunications University, Nha Trang, Vietnam A Proposal of Wireless Sensor Network System for Slope Failure Detection Using Smartphones
Yafei Hou, Manato Fujimoto, Hirohiko Suwa, Yutaka Arakawa (NAIST), Julian Webber, Kazuto Yano, Satoshi Tsukamoto, Tomoaki Kumagai (ATR), Michinori Hatayama (Kyoto University)
Due to frequency occurrence of Typhon and heavy rain and the increase of the landslide disaster, using wireless networks... [more]
EMD 2015-11-06
12:40
Miyagi Tohoku University, School of engineering, Aoba memorial hall Estimation of Inductance at Surface Structure in Contact Surfaces of Coaxial Connector
Tomoya Sato (Tohoku Univ.), Yu-ichi Hayashi (Tohoku Gakuin Univ.), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMD2015-81
When a connector has contaminated surfaces or weak contact force, nonuniform current distribution between the real conta... [more] EMD2015-81
pp.77-82
CQ 2015-07-07
11:35
Nara Nara Institute of Science and Technology A New Method of Approximation for Computing Failure Frequency of System
Masahiro Hayashi (Tokyo City Univ.) CQ2015-35
An approximation method for computing the frequency of system failure is proposed. We took a conventional approximation ... [more] CQ2015-35
pp.81-86
EMD 2013-11-16
10:30
Overseas Huazhong University of Science and Technology, Wuhan, P.R.China Investigation of Noise Interference due to Connector Contact Failure in a Coaxial Cable
Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMD2013-82
Increased inductance values and contact resistance in connector contact surfaces due to degradation of connector contact... [more] EMD2013-82
pp.31-33
CQ, MoNA, IPSJ-DPS, IPSJ-CN, IPSJ-EIP
(Joint) [detail]
2013-09-12
10:10
Ishikawa Kanazawa Institute of Technology Time-specific Failure Frequency Analysis for Telecommunications Networks
Tsubasa Kogami, Masahiro Hayashi (Tokyo City Univ.) CQ2013-32
This paper proposes a new approach to analyze time-specific failure frequency and time-specific success frequency for te... [more] CQ2013-32
pp.23-28
CQ 2012-07-13
15:25
Ehime Ehime Univ. The Effect of Reliability on the Management index of Telecommunication Service Company
Masahiro Hayashi (Tokyo City Univ.) CQ2012-40
This paper gives an extended approach of analyzing the effect of reliability on the management index of telecommunicatio... [more] CQ2012-40
pp.137-142
EMD, R 2012-02-17
11:00
Kyoto   An experimental study on contact resistance characteristics of relay contacts operated in the vicinity of a new acryl-based polymer
Makoto Hasegawa, Nanae Kobayashi (Chitose Inst. of Science and Technology), Yoshiyuki Kohno, Hiroshi Ando (Kaneka Corp.) R2011-43 EMD2011-117
The authors have already reported that when relays were operated to break load currents in vapors evaporated from a newl... [more] R2011-43 EMD2011-117
pp.7-12
EMD 2011-11-17
17:10
Akita Akita Univ. Tegata Campus Contact Resistance Characteristics of Relays Operated in Vapors Evaporated from Cured Polymeric Products
Nanae Kobayashi, Makoto Hasegawa (Chitose Inst. of Science & Tech.), Yoshiyuki Kohno, Hiroshi Ando (Kaneka) EMD2011-85
The authors have already reported that when relays were operated to break load currents in vapors evaporated from an acr... [more] EMD2011-85
pp.97-102
CQ, MVE, IE
(Joint) [detail]
2011-03-08
16:35
Nagasaki Yasuragi IOUJIMA A Study of Reliability Measure for Telecommunications Networks
Masahiro Hayashi (NTT Corp.) CQ2010-84
Unavailability, which is obtained by multiplying failure frequency (the mean number of outages per a unit time) & MTTR (... [more] CQ2010-84
pp.99-104
EMD, R 2011-02-18
13:55
Shizuoka Shizuoka Univ. (Hamamatsu) An experimental study on contact resistance characteristics of relay contacts in evaporated vapor atmospheres
Makoto Hasegawa, Nanae Kobayashi (Chitose. Inst. of Sci. & Tech.), Yoshiyuki Kohno (Kaneka) R2010-44 EMD2010-145
Influences of vapors evaporated from an acryl-based non-silicone-type polymeric cured product and conventional silicone-... [more] R2010-44 EMD2010-145
pp.13-18
EMD 2010-11-11
14:30
Overseas Xi'an Jiaotong University An experimental study on contact resistance characteristics of relay contacts operated in the vicinity of polymer materials
Nanae Kobayashi, Makoto Hasegawa (Chitose Inst. of Science and Tech.), Yoshiyuki Kohno (Kaneka) EMD2010-85
A commercially-available mechanical relay (AgSnIn contacts) was sealed into a can with a silicone-containing polymer mat... [more] EMD2010-85
pp.77-80
EMD 2010-11-12
09:00
Overseas Xi'an Jiaotong University An Analysis of EM Radiation from Transmission Line with Loose Contact of Connector
Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMD2010-99
Recently, for the electrical devices working at a high frequency bands, suppression of electromagnetic radiation field o... [more] EMD2010-99
pp.133-136
EMD, R 2010-02-19
13:25
Osaka   An experimental study on influences of silicone-type and non-silicone-type polymeric materials on contact resistance characteristics of relay contacts (III)
Makoto Hasegawa (Chitose Inst. of Sci. and Tech.), Yoshiyuki Kohno (Kaneka Corp.) R2009-52 EMD2009-119
Influences of vapors evaporated from a newly-developed acryl-based polymeric material (containing no silicone components... [more] R2009-52 EMD2009-119
pp.13-18
ICD 2009-12-14
10:50
Shizuoka Shizuoka University (Hamamatsu) [Invited Talk] Experimental Evaluation Technique for Power Supply Noise and Logical Operation Failure
Mitsuya Fukazawa (Renesas Technology Corp.), Makoto Nagata (Kobe Univ.) ICD2009-77
Logical operations in CMOS digital integration are highly prone to fail as the amount of power supply (PS) drop approach... [more] ICD2009-77
pp.7-12
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