Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM, ICD, ITE-IST [detail] |
2021-08-18 11:00 |
Online |
Online |
[Invited Talk]
Demonstration of HfO2-based ferroelectric ultra-thin films with low operating voltage, low process temperature, and high endurance
-- Toward embedded memory in advanced technology nodes -- Kasidit Toprasertpong, Kento Tahara (Univ. Tokyo), Yukinobu Hikosaka, Ko Nakamura, Hitoshi Saito (Fujitsu Semiconductor Memory Solution), Mitsuru Takenaka, Shinichi Takagi (Univ. Tokyo) SDM2021-38 ICD2021-9 |
In this study, we demonstrate the importance of the thickness scaling of Hf0.5Zr0.5O2 thin films for the ferroelectric m... [more] |
SDM2021-38 ICD2021-9 pp.42-47 |
SDM |
2018-06-25 16:15 |
Aichi |
Nagoya Univ. VBL3F |
Concern of Ferroelectric HfO2 Films Brought by Large Coercive Field Shinji Migita, Hiroyuki Ota (AIST), Akira Toriumi (Univ. Tokyo) SDM2018-25 |
Ferroelectric HfO2-based thin films are attractive memory materials for application in LSI. These ferroelectrics have la... [more] |
SDM2018-25 pp.43-46 |
ICD |
2016-04-14 14:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Lecture]
A Triple-Protection Structured COB FRAM with 1.2-V Operation and 1E17-Cycle Endurance Hitoshi Saito, Ko Nakamura, Soichiro Ozawa, Naoya Sashida, Satoru Mihara, Yukinobu Hikosaka, Wensheng Wang, Tomoyuki Hori, Kazuaki Takai, Mitsuharu Nakazawa, Noboru Kosugi, Makoto Hamada, Shoichiro Kawashima, Takashi Eshita, Masato Matsumiya (FSL) ICD2016-9 |
We have developed a ferroelectric RAM (FRAM) with a low operation voltage of 1.2 V and a high switching endurance up to ... [more] |
ICD2016-9 pp.45-49 |
ICD |
2016-04-15 10:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Talk]
A 90nm Embedded 1T-MONOS Flash Macro for Automotive Applications with 0.07mJ/8kB Rewrite Energy and Endurance Over 100M Cycles Under Tj of 175°C Satoru Nakanishi, Hidenori Mitani, Ken Matsubara, Hiroshi Yoshida, Takashi Kono, Yasuhiko Taito, Takashi Ito, Takashi Kurafuji, Kenji Noguchi, Hideto Hidaka, Tadaaki Yamauchi (Renesas) ICD2016-15 |
A first-ever 90nm embedded 1T-MONOS Flash macro is presented to realize automotive reliability and simple process integr... [more] |
ICD2016-15 pp.77-81 |
SAT, SANE (Joint) |
2016-02-17 09:55 |
Hiroshima |
Hiroshima Institute of Technology |
Preliminary Conceptual Study for the Scale Model Stratospheric Flight Experiment of a High Altitude Long Endurance UAS Daisuke Kubo, Kenya Harada (JAXA) SAT2015-72 |
JAXA has been conducting a conceptual design of a high altitude long endurance (HALE) unmanned aircraft systems (UAS) fo... [more] |
SAT2015-72 pp.51-54 |
EMD |
2014-11-29 13:00 |
Hokkaido |
Chitose Cultural Center |
[Invited Talk]
Welding in separation of electrical contacts Yang Xiaocheng, Liu Jinyou, Wang Qian, Li Zhenbiao, Cai Bingbing, Wang Danjiang (HUST) EMD2014-69 |
Electrical endurance tests are conducted with AgSnO2 and AgNi contacts on simulation test device. Waveforms of contact f... [more] |
EMD2014-69 pp.25-30 |
ICD |
2013-04-11 11:40 |
Ibaraki |
Advanced Industrial Science and Technology (AIST) |
[Invited Talk]
Filament Scaling Forming Technique and Level-Verify-Write Scheme with Endurance Over 10 million Cycles in ReRAM Akifumi Kawahara, Ken Kawai, Yuuichirou Ikeda, Yoshikazu Katoh, Ryotaro Azuma, Yuhei Yoshimoto, Kouhei Tanabe, Zhiqiang Wei, Takeki Ninomiya, Koji Katayama, Shunsaku Muraoka, Atsushi Himeno, Kazuhiko Shimakawa, Takeshi Takagi, Kunitoshi Aono (Panasonic) ICD2013-4 |
Endurance characteristics over 10 million cycles almost 10 times higher as existing, and the small filament for leading ... [more] |
ICD2013-4 pp.15-20 |
EMD, R |
2012-02-17 15:30 |
Kyoto |
|
Relationship between Electrical Contact Shapes and Electrical Endurance Fuminori Takeuchi, Koji Takami, Tetsuya Mori (OMRON) R2011-51 EMD2011-125 |
In power relay, smaller contact volume generally leads to lower electrical endurance. However, for requirement of device... [more] |
R2011-51 EMD2011-125 pp.51-54 |
EMD |
2010-11-11 17:45 |
Overseas |
Xi'an Jiaotong University |
Research of the Operation Characteristics Influence on the Breaking Capacity of Delaying Auxiliary Switch Lijun Jin, Ke Wang (Tongji Univ.) EMD2010-96 |
Auxiliary switch is the closing-opening control element for secondary control circuit of high voltage circuit breaker, t... [more] |
EMD2010-96 pp.121-124 |
MBE |
2008-10-30 16:40 |
Osaka |
Osaka Electro-Communication University |
Does Low-intensity Endurance Exercise Change Cardiovascular Function ?
-- Evaluation Using Wave Intensity -- Midori Tanaka, Tadafumi Izumi, Itirou Tarui, Motoaki Sugawara (Himeji Dokkyo Univ.) MBE2008-61 |
Abstract
Now a days, the number of elderly patients with heart disease who are undergoing low-intensity endurance exe... [more] |
MBE2008-61 pp.37-40 |