|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
CPSY, DC, IPSJ-SLDM, IPSJ-EMB [detail] |
2011-03-18 10:05 |
Okinawa |
|
Diagnosis for Automotive Electronic Control System
-- Extraction of Singular Relation from CAN data with WPMax-SAT -- Shuichi Sato, Takuro Kutsuna (TCRDL), Naoya Chujo (AIT), Noriyoshi Sano (TCRDL) CPSY2010-72 DC2010-71 |
Fault localization must be getting more tough problem for automotive electronic control systems in integration testing a... [more] |
CPSY2010-72 DC2010-71 pp.39-44 |
CAS, NLP |
2007-10-18 14:00 |
Tokyo |
Musashi Institute of Technology |
An Approach for Reducing Common-Mode Current on Electronic Control Units Using Optimization Algorithm Kohei Shinomiya, Hideki Asai (Shizuoka Univ.), Takanori Uno (DENSO) CAS2007-45 NLP2007-73 |
With the progress of packaging technologies, electronic circuits are designed with smaller devices and higher clock spee... [more] |
CAS2007-45 NLP2007-73 pp.61-66 |
|
|
|
Copyright and reproduction :
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
|
[Return to Top Page]
[Return to IEICE Web Page]
|