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Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ, EMD, WPT, PEM
(Joint) [detail]		 2019-07-19
11:25		 Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Lecture] Development of High Frequency Electric Field Sensor with Optically Modulated Scattering Technique and its Application to EMC Noise Scanner
Takahiro Kurosawa (AITC), Takashi Komakine (Akita NCT) 		Electric field measurement sensor based on the modulated scattering technique with optically modulated scatterer had dev... [more]
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