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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| RECONF | 2013-05-21 11:25 |
Kochi | Kochi Prefectural Culture Hall | A defect-robust FPGA-IP core architecture Motoki Amagasaki, Kazuki Inoue, Qian Zhao, Masahiro Iida, Morihiro Kuga, Toshinori Sueyoshi (Kumamoto Univ.)  RECONF2013-13 |
In this paper, we propose fault-tolerant FPGA -IP cores for system LSI. Unlike discrete FPGAs, in which the integration... [more] |
RECONF2013-13 pp.67-72 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2012-11-26 16:00 |
Fukuoka | Centennial Hall Kyushu University School of Medicine | Impact of Body-Biasing Technique on RTN-induced Delay Fluctuation Takashi Matsumoto (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Inst. Tech.), Hidetoshi Onodera (Kyoto Univ.) VLD2012-70 DC2012-36 |
Designing reliable systems has become more difficult in recent years. In this paper, statistical nature of RTN-induced ... [more] |
VLD2012-70 DC2012-36 pp.63-68 |
| VLD | 2012-03-07 09:40 |
Oita | B-con Plaza | Design automation of highly reliable VLSI by redundancy FF replacement method Ken Yano, Takahito Yoshiki, Takanori Hayashida, Toshinori Sato (Fukuokadai) VLD2011-133 |
Design automation of highly reliable VLSI using canary FF is proposed. Canary FF is used to detect timing error caused f... [more] | VLD2011-133 pp.79-84 |
| DC | 2011-12-16 13:30 |
Hyogo | Development of Dependable Data Logger for Inline Production Management Masaya Ohta (Nihon univ.), Kazumi Sakamaki, Yasuaki Kaneda, Yasuharu Irizuki (TIRI), Masanobu Yamazaki, Kazuhiko Horigome (KT), Hiroshi Mochizuki, Hideo Nakamura (Nihon univ.) DC2011-68 |
In this paper, we report an architecture of protection against data falsification, integrity of the collected data, secu... [more] | DC2011-68 pp.3-7 |
|
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-29 15:05 |
Miyazaki | NewWelCity Miyazaki | Multi-core LSI Lifetime Extension by NBTI-Recovery-based Self-healing Takashi Matsumoto, Hiroaki Makino (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Inst. Tech.), Hidetoshi Onodera (Kyoto Univ.) CPM2011-160 ICD2011-92 |
Designing reliable systrems has become more difficult in recent years. Negative-Bias-Temperature-In-stability (NBTI) is ... [more] | CPM2011-160 ICD2011-92 pp.59-63 |
| CPSY | 2011-10-21 09:30 |
Hyogo | Dependability evaluation of processor using the dependable SRAM by system-level fault injection Yusuke Takeuchi, Yohei Nakata (Kobe Univ.), Yasuhiro Ito, Yasuo Sugure, Shigeru Oho (Hitachi), Shunsuke Okumura, Hiroshi Kawaguchi (Kobe Univ.), Masahiko Yoshimoto (Kobe Univ./JST) CPSY2011-25 |
We propose a fault-injection system (FIS) that can inject faults such as read/write margin failures and soft errors into... [more] | CPSY2011-25 pp.1-6 |
|
| ICD, ITE-IST | 2011-07-22 15:20 |
Hiroshima | Hiroshima Institute of Technology | [Invited Talk]
Implementation of Broadband Wireless Communication System Using Frequency-Domain Equalization Suguru Kameda (Tohoku Univ.) ICD2011-35 |
Frequency-domain equalization (FDE) method is necessary for realizing "Dependable Air", which is broadband and wide-ar... [more] |
ICD2011-35 pp.113-118 |
| ICD | 2010-12-16 15:10 |
Tokyo | RCAST, Univ. of Tokyo | [Poster Presentation]
A 65nm CMOS High-Speed and High-Fidelity NBTI Recovery Sensor Takashi Matsumoto, Hiroaki Makino (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Inst. Tech.), Hidetoshi Onodera (Kyoto Univ.) ICD2010-104 |
We proposed an NBTI-recovery sensor with 400ns measurement delay. This sensor contains many unit cells. One unit cell in... [more] | ICD2010-104 pp.55-58 |
| DC | 2010-12-10 14:00 |
Tottori | International Family Plaza (Yonago) | A Study on Dependable Data Logger for Inline Production Management Masaya Ohta (Nihon Univ.), Kazumi Sakamaki, Yasuaki Kaneda, Yasuharu Irizuki (TIRI), Masanobu Yamazaki, Kazuhiko Horigome (K.T. Mfg. Co., Ltd), Hiroshi Mochizuki, Hideo Nakamura (Nihon Univ.) DC2010-52 |
In this paper, we report an architecture of protection against data falsification, integrity of the collected data, and ... [more] | DC2010-52 pp.5-8 |
| RECONF | 2008-09-26 13:20 |
Okayama | Okayama Univ. | A study of a fault-tolerant System using TFT method Atsuhiro Kanamaru, Hiroyuki Kawai, Yoshiki Yamaguchi, Moritoshi Yasunaga (Univ. of Tsukuba) RECONF2008-36 |
This paper deals with a dependable computing system using a reconfigurable device. The work carried out for this purpos... [more] | RECONF2008-36 pp.81-86 |
| VLD, IPSJ-SLDM | 2008-05-09 14:35 |
Hyogo | Kobe Univ. | A Dependable SRAM with high-reliability mode and high-speed mode. Shunsuke Okumura, Hidehiro Fujiwara, Yusuke Iguchi, Hiroki Noguchi, Yasuhiro Morita, Hiroshi Kawaguchi, Masahiko Yoshimoto (Kobe Univ.) |
We propose a novel dependable SRAM with 7T memory cell pair, and introduce a new concept, “quality of a bit （QoB）” for i... [more] | VLD2008-12 pp.31-36 |
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