Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
WPT, EE (Joint) |
2020-10-07 15:05 |
Online |
Online |
Measurement Method of High-Frequency-Voltage/Current Waveforms using Directional Coupler and its Calibration Takuma Nakae, Hiroshi Hirayama (NIT) WPT2020-22 |
This report proposes a measurement method of voltage/current waveform assuming applications of wireless power transfer(W... [more] |
WPT2020-22 pp.18-23 |
US |
2019-08-28 13:50 |
Tokyo |
|
New Remote Water Thermometer Using Ultrasonic Doppler Shift Shokichi Tanaka, Hideyuki Nomura, Tomoo Kamakura (UEC) US2019-39 |
Water temperature distribution in sea water is essential information for analysis of sound wave propagation and monitori... [more] |
US2019-39 pp.11-16 |
EMCJ |
2019-04-11 13:05 |
Okinawa |
Okinawa Industry Support Center |
A Novel Modeling Method for Bulk Current Injection Probe Clamping Multiple Wires Takanori Uno, Ichiro Akahori (DENSO EMCES), Yoichiro Hara, Yasunori Iwata (DENSO TECHNO) EMCJ2019-1 |
In this paper, consideration is made to create a simulation model of the BCI test method, which is one of the EMC evalua... [more] |
EMCJ2019-1 pp.1-6 |
EMCJ, IEE-EMC, IEE-MAG |
2018-11-22 14:00 |
Overseas |
KAIST |
Investigation of CAN transceiver and controller response to electromagnetic disturbance by using current injection probe Ryunosuke Isshiki, Kengo Iokibe, Takuya Kusaka, Tetsushi Kamegawa, Yasuyuki Nogami (Okayama Univ.) EMCJ2018-63 |
Recently, connected cars are having a major role on modern traffic system. However, it might include vulnerability and i... [more] |
EMCJ2018-63 pp.23-28 |
EMCJ |
2018-07-27 13:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Measurement of discharge current using shielded-loop probe caused by ESD in spherical electrodes. Masato Oikawa, Kento Kato, Shinobu Ishigami, Ken Kawamata, Shigeki Minegishi (Tohoku Gakuin Univ.), Osamu Fujiwara (Nagoya Inst. of Tech.) EMCJ2018-28 |
The relationship between the electromagnetic radiation intensity accompanying the spherical electrode ESD and the peak d... [more] |
EMCJ2018-28 pp.37-42 |
AP, WPT (Joint) |
2017-01-20 13:20 |
Hiroshima |
Hiroshima Institute of Technology |
Accurate Measurement of Transfer Efficiency of Air-Core Transcutaneous Energy Transmission Transformers for Ventricular Assist Devices
-- Comparison between Theoretical Estimates and Measured Values Using Various Measurement Devices -- Tadashi Kaga, Kenji Shiba (TUS) WPT2016-52 |
Transcutaneous energy transmission systems use inductive coupling techniques to transfer energy to ventricular assist de... [more] |
WPT2016-52 pp.57-62 |
ICD, CPSY |
2016-12-15 15:30 |
Tokyo |
Tokyo Institute of Technology |
[Poster Presentation]
CMOS Transimpedance Analog Front End Circuit for an Optical Probe Current Sensor Kousuke Oyangi, Kousuke Miyaji (Shinshu Univ.) ICD2016-74 CPSY2016-80 |
An optical probe current sensor using the magneto-optical effect has been studied for power electronics. This sensor sho... [more] |
ICD2016-74 CPSY2016-80 p.67 |
AP (2nd) |
2014-12-19 09:40 |
Kagoshima |
Tanegashima Space Center |
Estimation of Directivity and Gain Calculation on Array Antennas by Using 1D Electric Current Distribution Eriko Ohashi, Hiroyuki Arai (Yokohama National Univ.) |
In this paper, we estimate radiation directivity and gain of a linear dipole array (LDA) and a linear patch array (LPA) ... [more] |
|
EMD, R |
2013-02-15 13:35 |
Mie |
Sumitomo Wiring System, Ltd |
Visualization of electric current in contact and effect of thin film on contact resistance Shigeru Sawada, Shigeki Tsukiji (Mie Univ.), Shigeki Shimada (Sumitomo Electric Industries), Terutaka Tamai (Elcontech), Yasuhiro Hattori (ANTech) R2012-72 EMD2012-103 |
The mathematical solutions and electrical field analysis results of current density distribution in electric contact hav... [more] |
R2012-72 EMD2012-103 pp.1-6 |
EMCJ |
2013-01-10 11:20 |
Nagasaki |
Nagasaki Univ. |
Validation of numerical simulation for intermediate frequency band based on the measurement of induced electric field inside phantom Shinya Tamata, Alfred Kik, Yukihisa Suzuki (tmu), Akimasa Hirata (nitech) EMCJ2012-105 |
Numerical simulations are the general trend for the dosimetry of contact current. However, there is no experimental inve... [more] |
EMCJ2012-105 pp.19-23 |
EMCJ |
2012-09-07 15:40 |
Hokkaido |
Hkkaido Univ. |
A simulation model of bulk current injection (BCI) test Hiroya Tanaka, Atsuhiro Takahashi, Yoshiyuki Hattori (Toyota Central R&D Labs.), Masato Izumichi (DENSO CORPORATION) EMCJ2012-60 |
BCI test is used to evaluate a noise immunity of in-vehicle electronic
equipment. To predict an injected current into ... [more] |
EMCJ2012-60 pp.47-50 |
EMCJ |
2012-04-20 13:25 |
Ishikawa |
Kanazawa Univ. |
Proposal of a new technique and probe for the current measurement of each pin in a BGA package Takeshi Nakayama, Daisaku Kitagawa, Masahiro Ishii, Yoshiyuki Saito (Panasonic) EMCJ2012-3 |
To maintain operational stability of LSI, power supply and ground pin count has increased. This is one of the factors of... [more] |
EMCJ2012-3 pp.13-18 |
EMCJ |
2012-04-20 13:50 |
Ishikawa |
Kanazawa Univ. |
Placement optimization of the ground pins based on the measurement results of the currents flowing through each ground pin Takeshi Nakayama, Daisaku Kitagawa, Masahiro Ishii, Yoshiyuki Saito (Panasonic) EMCJ2012-4 |
To maintain operational stability of LSI, power supply and ground pin count has increased. This is one of the factors of... [more] |
EMCJ2012-4 pp.19-24 |
EMCJ |
2011-11-25 13:30 |
Tokyo |
Univ. of Electro-Communiations |
Effect of moving speed of charged metal spherical electrode on spark discharge between charged metal spherical electrode and grounded body Hajime Tomita (JNIOSH), Yasunori Ohkuma (Nihon Univ.) EMCJ2011-89 |
In this study, we experimentally clarified the nature of the characteristics of the spark discharge that occurs when a c... [more] |
EMCJ2011-89 pp.7-12 |
EMCJ |
2011-11-25 14:20 |
Tokyo |
Univ. of Electro-Communiations |
Mode-equivalent Modeling and Identification of System with Cable Interconnection between Transmitter and Receiver Pairs (Part 3) Yoshitaka Toyota, Kota Sejima, Kengo Iokibe, Ryuji Koga (Okayama Univ.), Tetsushi Watanabe (ITCO) EMCJ2011-91 |
We focus on the expression by using modal equivalent-circuit model. The goal of this study is to clarify the mechanism o... [more] |
EMCJ2011-91 pp.19-24 |
EMCJ, EMD |
2010-07-16 14:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
ESD waveform measurement with current probe and optical voltage probe Mikiya Iida (Toshiba Corp.) EMCJ2010-36 EMD2010-21 |
ESD causes the malfunction of an electronic equipment. In order to clarify the ESD influence to malfunction mechanism, i... [more] |
EMCJ2010-36 EMD2010-21 pp.25-30 |
EMCJ, IEE-EMC |
2009-12-18 13:25 |
Gifu |
NIFS |
Representation of Equivalent Circuit to Estimate Injected Currents for Contact Discharge of ESD-Generators Fumihiko Toya, Yoshinori Taka, Osamu Fujiwara (Nagoya Inst. of Tech.), Shinobu Ishigami, Yukio Yamanaka (NICT) EMCJ2009-93 |
International electrotechnical commission (IEC) prescribes an immunity test (IEC61000-4-2) of electronic equipment for e... [more] |
EMCJ2009-93 pp.49-53 |
ICD |
2009-12-14 10:00 |
Shizuoka |
Shizuoka University (Hamamatsu) |
[Invited Talk]
Image Sensor
-- An absorbing device with the hardest design -- Satoshi Aoyama, Park Jong-Ho, Takashi Watanabe (Brookman Tech.), Shoji Kawahito (Brookman Tech./Shizuoka Univ.) ICD2009-76 |
Many kinds of image sensors are used in various fields as for the key device of the image input, as well as other inform... [more] |
ICD2009-76 pp.1-5 |
MW |
2009-06-30 13:30 |
Aichi |
Nagoya Institute of Technology |
An Experimental Study for Current Distribution of ICs under the operation by Non-contact Measurement Takuto Watanabe, Osamu Hashimoto (Aoyama Gakuin Univ.) MW2009-23 |
With the innovative miniaturization and the high speed operation of the recent electric devices, the operating frequency... [more] |
MW2009-23 pp.25-30 |
EMCJ |
2009-04-24 14:55 |
Okayama |
|
Estimation of Discharge Currents Injected onto Ground for Contact Discharge from ESD-Gun Fumihiko Toya, Yoshinori Taka, Osamu Fujiwara (Nagoya Inst. of Tech.), Shinobu Ishigami, Yukio Yamanaka (NICT) EMCJ2009-5 |
International Electrotechnical Commission (IEC) prescribes an immunity test (IEC61000-4-2) of electronic equipment for e... [more] |
EMCJ2009-5 pp.25-29 |