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Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ, IEE-EMC, IEE-MAG 2018-11-22
11:30		 Overseas KAIST [Invited Talk] Security Simulation of Cryptographic Module in Side-Channel Attack
Kengo Iokibe, Yoshitaka Toyota (Okayama Univ.) EMCJ2018-61		 Side-channel attacks (SCAs) are one of the biggest threats to cryptography and one of important issues in IoT modules, c... [more] EMCJ2018-61
p.19
EMCJ, IEE-EMC, IEE-MAG 2017-05-18
14:46		 Overseas Nanyang Technological University [Poster Presentation] Electromagnetic Information Leakage Analysis of Cryptographic IC in Correlation Power Analysis
Yasunari Kumano, Yusuke Yano, Kengo Iokibe, Hiroto Kagotani, Yoshitaka Toyota (Okayama Univ.) EMCJ2017-10		 We observed and analyzed electromagnetic information leakage of the Advanced Encryption Standard (AES) cryptographic cir... [more] EMCJ2017-10
pp.7-8
EMCJ, IEE-EMC, MW, EST [detail] 2016-10-21
09:00		 Miyagi Tohoku Univ. Attempt for Determining Cryptographic Circuit Blocks Leaking Side-Channel Information Based on Internal Current Source -- Examination with FPGA Implementation of AES Circuits --
Kengo Iokibe, Naoki Kawata, Yusuke Yano, Hiroto Kagotani, Yoshitaka Toyota (Okayama Univ.) EMCJ2016-74 MW2016-106 EST2016-70		 For efficient security enhancement of cryptographic ICs against side-channel attacks (SCAs), it is important to identify... [more] EMCJ2016-74 MW2016-106 EST2016-70
pp.79-84
EMCJ, IEE-EMC 2014-12-19
16:05		 Shizuoka Shizuoka Univ. Security Evaluation of CSSAL Countermeasure against Side-Channel Attacks Using Frequency Spectrum Analysis
Cancio Monteiro, Yasuhiro Takahashi, Toshikazu Sekine (Gifu Univ.) EMCJ2014-82		 Information leakage on cryptographic devices are possible because of the correlation between the processed data and its ... [more] EMCJ2014-82
pp.75-80
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2010-12-01
11:05		 Fukuoka Kyushu University A study of the success rate of MIA under various probability density function estimations
Yohei Hori (AIST), Takahiro Yoshida (Aoyama Univ.), Toshihiro Katashita, Akashi Satoh (AIST) RECONF2010-48		 The pfrobability density function (PDF) of voltage of AES hardware
module is estimated in various ways and applied to ... [more]		 RECONF2010-48
pp.55-60
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