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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
HIP, ITE-HI, ASJ-H, VRPSY [detail] |
2022-02-28 11:10 |
Online |
Online |
Effects of color attributes on visual texture perception of food Jiayun Chen, Katsunori Okajima (YNU) HIP2021-69 |
(To be available after the conference date) [more] |
HIP2021-69 pp.58-61 |
IA |
2017-11-15 16:30 |
Overseas |
KMITL, Bangkok, Thailand |
[Poster Presentation]
Smart Agriculture Service Cloud Platform
-- Practices and Implementations -- Hsin-Yun Chen, Yu-Hung Chen, Bo-Wei Chen, Jun-Yu Yang, Jiann-Liang Chen, Shih-Ping Chiu (Taiwan Tech) IA2017-35 |
With the popularity and development of the Internet, people began to use the network in different field of developing a ... [more] |
IA2017-35 pp.27-32 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-29 09:50 |
Miyazaki |
NewWelCity Miyazaki |
A Scan Chain Construction Method to Reduce Test Data Volume on BAST Yun Chen, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyushu Univ.) VLD2011-73 DC2011-49 |
BAST is one of techniques which are combined ATPG and BIST to reduce the amount of test data while maintaining the high ... [more] |
VLD2011-73 DC2011-49 pp.127-132 |
DC |
2010-06-25 15:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A test pattern matching method on BAST architecture using don't care identification for the detection of random pattern resistant faults Yun Chen, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyushu Univ.) DC2010-11 |
BAST is one of techniques which are combined ATPG and BIST to reduce the amount of test data while maintaining the high ... [more] |
DC2010-11 pp.19-24 |
SDM, OME |
2008-04-11 09:00 |
Okinawa |
Okinawa Seinen Kaikan |
[Invited Talk]
Location control of super lateral growth in excimer laser crystallization of Si film by micro-melt seeding method Wenchang Yeh, Hanseng Dai, Hsinchi Chen, Bingcyun Chen (NTUST) SDM2008-1 OME2008-1 |
[more] |
SDM2008-1 OME2008-1 pp.1-6 |
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