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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD, CPM 2005-01-28
11:15
Tokyo Kikai-Shinko-Kaikan Bldg. Improvement of RTL Fault Diagnosis Technology for Practical Use
Masafumi Nikaido, Yukihisa Funatsu (NEC Electronics Corporation)
RTL (Register Transfer Level) fault diagnosis technique based on backtracking the node in Assignment Decision Diagrams (... [more] CPM2004-166 ICD2004-211
pp.25-30
ICD, CPM 2005-01-28
16:45
Tokyo Kikai-Shinko-Kaikan Bldg. Development of Multiple Fault Diagnosis Based on Path-Tracing for Logic LSIs
Yukihisa Funatsu, Hiroshi Sumitomo, Kazuki Shigeta, Toshio Ishiyama (NECEL)
For recent highly integrated and shrunk LSIs, CAD-based fault diagnosis technology which supports physical failure analy... [more] CPM2004-174 ICD2004-219
pp.71-76
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