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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 8 of 8  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD 2017-04-21
11:00		 Tokyo   [Invited Lecture] Highly reliable Cu atom switch using thermally tolerant Polymer-solid Electrolyte (TT-PSE) for Nonvolatile Programmable Logic
Koichiro Okamoto, Munehiro Tada, Naoki Banno, Noriyuki Iguchi, Hiromitsu Hada, Toshitsugu Sakamoto, Makoto Miyamura, Yukihide Tsuji, Ryusuke Nebashi, Ayuka Morioka, Xu Bai, Tadahiko Sugibayashi (NEC) ICD2017-13		 Robust Cu atom switch with higher operation reliability has been developed featuring an over-400C thermally tolerant pol... [more] ICD2017-13
pp.67-72
ICD 2017-04-21
11:25		 Tokyo   [Invited Lecture] A 2x Logic Density Programmable Logic Array using Atom Switch
Yukihide Tsuji, Xu Bai, Ayuka Morioka, Miyamura Makoto, Ryusuke Nebashi, Toshitsugu Sakamoto, Munehiro Tada, Naoki Banno, Koichiro Okamoto, Noriyuki Iguchi, Hiromitsu Hada, Tadahiko Sugibayashi (NEC) ICD2017-14		 (To be available after the conference date) [more] ICD2017-14
pp.73-78
SDM, ICD 2015-08-24
13:35		 Kumamoto Kumamoto City [Invited Talk] Atom-Switch-Based Programmable Logic Array and ROM
Yukihide Tsuji, X Bai, Makoto Miyamura, Toshitsugu Sakamoto, Munehiro Tada, Naoki Banno, Koichiro Okamoto, Noriyuki Iguchi (NEC), Nobuyuki Sugii (Hitachi), Hiromitsu Hada (NEC) SDM2015-61 ICD2015-30		 We have proposed Nonvolatile Programmable Logic (NPL) and ROM using atom switch. Atom switch has unique properties, such... [more] SDM2015-61 ICD2015-30
pp.19-24
ICD, SDM 2014-08-04
14:55		 Hokkaido Hokkaido Univ., Multimedia Education Bldg. [Invited Talk] A 90-nm Three-terminal MRAM Embedded Nonvolatile Microcontroller for Standby-Power-Critical Applications
Noboru Sakimura, Yukihide Tsuji, Ryusuke Nebashi, Hiroaki Honjo, Ayuka Morioka, Kunihiko Ishihara (NEC), Keizo Kinoshita, Shunsuke Fukami (Tohoku Univ.), Sadahiko Miura (NEC), Naoki Kasai, Tetsuo Endoh, Hideo Ohno, Takahiro Hanyu (Tohoku Univ.), Tadahiko Sugibayashi (NEC) SDM2014-69 ICD2014-38		  [more] SDM2014-69 ICD2014-38
pp.39-44
ICD 2014-04-18
15:15		 Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Lecture] A power-gated MPU with 3-microsecond entry/exit delay using MTJ-based nonvolatile flip-flop
Hiroki Koike (Tohoku Univ.), Noboru Sakimura, Ryusuke Nebashi, Yukihide Tsuji, Ayuka Morioka, Sadahiko Miura, Hiroaki Honjo, Tadahiko Sugibayashi (NEC), Takashi Ohsawa, Shoji Ikeda, Takahiro Hanyu, Hideo Ohno, Tetsuo Endoh (Tohoku Univ.) ICD2014-17		 We propose a novel power-gated microprocessor unit (MPU) using a nonvolatile flip-flop (NV-F/F) with magnetic tunnel jun... [more] ICD2014-17
pp.85-90
ICD 2013-04-11
16:20		 Ibaraki Advanced Industrial Science and Technology (AIST) Highly Reliable Logic Primitive Gates for Spintronics-Based Logic LSI
Yukihide Tsuji, Ryusuke Nebashi, Noboru Sakimura, Ayuka Morioka, Hiroaki Honjo, Keiichi Tokutome, Sadahiko Miura (NEC), Tetsuhiro Suzuki (Renesas Electronics Corp.), Shunsuke Fukami, Keizo Kinoshita, Takahiro Hanyu, Tetsuo Endoh, Naoki Kasai, Hideo Ohno (Tohoku Univ.), Tadahiko Sugibayashi (NEC) ICD2013-9		 Implementing redundancy within a Spintronis Primitive Gata (SPG) using multi-terminal DWM cells ensures high reliability... [more] ICD2013-9
pp.41-46
ICD 2012-04-24
10:50		 Iwate Seion-so, Tsunagi Hot Spring (Iwate) A Non-Volatile Content Addressable Memory Using Three-Terminal Magnetic Domain Wall Motion Cells
Ryusuke Nebashi, Noboru Sakimura, Yukihide Tsuji (NEC), Shunsuke Fukami (Tohoku Univ.), Hiroaki Honjo, Shinsaku Saito, Sadahiko Miura, Nobuyuki Ishiwata (NEC), Keizo Kinoshita, Takahiro Hanyu, Tetsuo Endoh, Naoki Kasai, Hideo Ohno (Tohoku Univ.), Tadahiko Sugibayashi (NEC) ICD2012-10		 A 5-ns search operation of a non-volatile content addressable memory was demonstrated. The CAM macro, with a capacity of... [more] ICD2012-10
pp.49-54
ICD, SDM 2009-07-17
10:20		 Tokyo Tokyo Institute of Technology [Invited Talk] NanoBridge embedded into Cu interconnect
Toshitsugu Sakamoto, Munehiro Tada, Yukihide Tsuji, Naoki Banno, Hiromitsu Hada (NEC Corp.), Masakazu Aono (NIMS) SDM2009-110 ICD2009-26		  [more] SDM2009-110 ICD2009-26
pp.69-72
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