Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SeMI |
2022-01-21 09:10 |
Nagano |
(Primary: On-site, Secondary: Online) |
[Short Paper]
A Study on the Location Estimation of the Drifting Observer in a Small Diameter Sewer Pipe by Acoustic Waves Kento Maruyama, Yusuke Chikamoto, Yuki Tsutsumi, Seiya Tachibana, Susumu Ishihara (Shizuoka Univ.) SeMI2021-71 |
[more] |
SeMI2021-71 pp.70-74 |
SRW, SeMI, CNR (Joint) |
2021-11-25 11:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Primary: On-site, Secondary: Online) |
Performance evaluation of data transmission in a narrow sewer pipe using UDP-based reliable data transfer protocols Seiya Tachibana, Yusuke Chikamoto, Yuki Tsutsumi, Susumu Ishihara (Shizuoka Univ.) SeMI2021-31 |
(To be available after the conference date) [more] |
SeMI2021-31 pp.7-12 |
SeMI |
2021-01-20 14:10 |
Online |
Online |
design and implementation of a data aggregation system for a sewer inspection system with drifting wireless cameras Yusuke Chikamoto, Seiya Tachibana, Yuki Tsutsumi, Susumu Ishihara (Shizuoka Univ.) SeMI2020-46 |
[more] |
SeMI2020-46 pp.16-21 |
SRW, SeMI, CNR (Joint) |
2020-11-26 16:00 |
Online |
Online |
[Poster Presentation]
On the performance of bulk data transmission from a drifting wireless LAN node in a narrow sewer pipe Seiya Tachibana, Yusuke Chikamoto, Yuki Tsutsumi, Susumu Ishihara (Shizuoka Univ.) SeMI2020-28 |
[more] |
SeMI2020-28 pp.51-56 |
RECONF |
2015-06-20 14:00 |
Kyoto |
Kyoto University |
On the Evaluation Board AISTino equipped with the Fourth Flex Power FPGA chip with SOTB transistors Hanpei Koike, Masakazu Hioki, Yasuhiro Ogasahara (AIST), Hayato Ishigaki, Toshiyuki Tsutsumi (Meiji Univ.), Tadashi Nakagawa, Toshihiro Sekigawa (AIST) RECONF2015-22 |
Flex Power FPGA utilizes threshold voltage programmability to reduce its static power by the body bias control of circui... [more] |
RECONF2015-22 pp.119-124 |
RECONF, CPSY, VLD, IPSJ-SLDM [detail] |
2015-01-30 11:10 |
Kanagawa |
Hiyoshi Campus, Keio University |
The proposal of the convex area maze router on LSI design automation Yohei Horino, Jun Hirayama, Yukiko Ohishi, Toshiyuki Tsutsumi (Meiji Univ.) VLD2014-138 CPSY2014-147 RECONF2014-71 |
We developed the convex area maze router that extends the channel intersection maze router as a high-speed routing algor... [more] |
VLD2014-138 CPSY2014-147 RECONF2014-71 pp.163-168 |
RECONF |
2014-09-18 17:20 |
Hiroshima |
|
On The Second Flex Power FPGA Chip with SOTB Transistors Hanpei Koike (AIST), Chao Ma (Meiji Univ.), Masakazu Hioki, Yasuhiro Ogasahara (AIST), Toshiyuki Tsutsumi (Meiji Univ.), Tadashi Nakagawa, Toshihiro Sekigawa (AIST) RECONF2014-24 |
[more] |
RECONF2014-24 pp.41-46 |
RECONF |
2014-06-12 10:25 |
Miyagi |
Katahira Sakura Hall |
Improvement of Implementability by Exploring Routing Architecture in Flex Power FPGA Masakazu Hioki, Toshihiro Sekigawa, Tadashi Nakagawa, Yasuhiro Ogasahara (AIST), Toshiyuki Tsutsumi (Meiji Univ.), Hanpei Koike (AIST) RECONF2014-5 |
(To be available after the conference date) [more] |
RECONF2014-5 pp.21-25 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2013-11-28 13:45 |
Kagoshima |
|
Evaluation of The First Flex Power FPGA chip with SOTB transistors Chao Ma (AIST/Meiji Univ.), Masakazu Hioki (AIST), Takashi Kawanami (KIT), Yasuhiro Ogasahara, Tadashi Nakagawa, Toshihiro Sekigawa (AIST), Toshiyuki Tsutsumi (AIST/Meiji Univ.), Hanpei Koike (AIST) RECONF2013-53 |
Flex Power FPGA was able to utilize a programmable threshold voltage to each circuit block of the FPGA by using the body... [more] |
RECONF2013-53 pp.77-82 |
DC |
2013-02-13 13:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Characteristic Analysis of Signal Delay for Resistive Open Fault Detection Hiroto Ohguri, Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ. of Tokushima), Toshiyuki Tsutsumi, Koji Yamazaki (Meiji Univ.), Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) DC2012-84 |
When a resistive open fault occurs, signal delay at the faulty wire may degrade circuit performance. However, a resistiv... [more] |
DC2012-84 pp.25-30 |
DC |
2012-06-22 14:20 |
Tokyo |
Room B3-1 Kikai-Shinko-Kaikan Bldg |
[Invited Talk]
Empirical study for signal integrity-defects Hiroshi Takahashi, Yoshinobu Higami (Ehime Univ.), Toshiyuki Tsutsumi, Koji Yamazaki (Meiji Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ. Tokushima) DC2012-12 |
We try to empirically study signal integrity-defects.
In this study, we analyze the resistive open fault that causes th... [more] |
DC2012-12 pp.21-26 |
RECONF |
2012-05-29 11:00 |
Okinawa |
Tiruru (Naha Okinawa, Japan) |
Development of a demonstration system for Ultra-low-power FPGA with Fine-Grained Field-Programmable Threshold Voltage Control Takashi Kawanami (KIT), Masakazu Hioki (AIST), Yohei Matsumoto (Kaiyo Univ.), Toshiyuki Tsutsumi (Meiji Univ.), Tadashi Nakagawa, Toshihiro Sekigawa, Hanpei Koike (AIST) RECONF2012-5 |
The Flex Power FPGA is a new FPGA architecture which enabled high speed operation and low power-consumption by fine-grai... [more] |
RECONF2012-5 pp.25-30 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-12-01 09:50 |
Fukuoka |
Kyushu University |
Fabrication in Low Power Process and Evaluation of Power Reconfigurable Field Programmable Gate Array Masakazu Hioki (AIST), Takashi Kawanami (KIT), Yohei Matsumoto (TUMSAT), Toshiyuki Tsutsumi (Meiji Univ.), Tadashi Nakagawa, Toshihiro Sekigawa, Hanpei Koike (AIST) RECONF2010-45 |
Flex Power FPGA that is FPGA with power reconfigurability aims at the reduction of static power. The reduction of off cu... [more] |
RECONF2010-45 pp.37-42 |
DC |
2010-02-15 10:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Modeling resistive open faults and generating their tests Hiroshi Takahashi, Yoshinobu Higami, Yuta Shudo, Yuji Takamune, Yuzo Takamatsu (Ehime Univ.), Toshiyuki Tsutsumi, Koji Yamazaki (Meiji Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ. of Tokushima) DC2009-68 |
In order to solve the problem of signal integrity, we propose an extended delay fault model for modeling a resistive ope... [more] |
DC2009-68 pp.19-24 |
DC |
2010-02-15 16:05 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Consideration of Open Faults Model Based on Digital Measurement of TEG Chip Toshiyuki Tsutsumi (Meiji Univ.), Yasuyuki Kariya, Koji Yamazaki (Meiji Univ), Masaki Hashizume, Hiroyuki Yotsuyanagi (Tokushima Univ), Hiroshi Takahashi, Yoshinobu Higami, Yuzo Takamatsu (Ehime Univ) DC2009-77 |
Countermeasures against an open fault in LSI testing become more important with advancement of LSI process technology. ... [more] |
DC2009-77 pp.75-80 |
RECONF |
2009-09-17 15:40 |
Tochigi |
Utsunomiya Univ. |
Design and Fabrication of Flex Power FPGA with Power Reconfigurability Masakazu Hioki (AIST), Takashi Kawanami (Kanazawa Inst. of Tech.), Yohei Matsumoto (AIST), Toshiyuki Tsutsumi (Meiji Univ.), Tadashi Nakagawa, Toshihiro Sekigawa, Hanpei Koike (AIST) RECONF2009-25 |
Our research group has evaluated “Flex Power FPGA” which can reconfigure the power from the viewpoint of software and ha... [more] |
RECONF2009-25 pp.37-42 |
DC |
2009-02-16 14:15 |
Tokyo |
|
On Tests to Detect Open faults with Considering Adjacent Lines Tetsuya Watanabe, Hiroshi Takahashi, Yoshinobu Higami (Ehime Univ.), Toshiyuki Tsutsumi, Koji Yamazaki (Meiji Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ, Tokushima), Yuzo Takamatsu (Ehime Univ.) DC2008-74 |
In modern manufacturing technologies with the shrinking of manufacturing process, LSIs may have several metal interconne... [more] |
DC2008-74 pp.37-42 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2008-11-17 14:15 |
Fukuoka |
Kitakyushu Science and Research Park |
Analysis of Open Fault using TEG Chip Toshiyuki Tsutsumi, Yasuyuki Kariya, Koji Yamazaki (Meiji Univ), Masaki Hashizume, Hiroyuki Yotsuyanagi (Tokushima Univ), Hiroshi Takahashi, Yoshinobu Higami, Yuzo Takamatsu (Ehime Univ) VLD2008-63 DC2008-31 |
The high integration of the semiconductor technology advances, and the fault detection and the failure diagnosis of LSI ... [more] |
VLD2008-63 DC2008-31 pp.19-24 |
DC |
2008-06-20 15:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg |
Improving the Diagnostic Quality of Open Faults Koji Yamazaki, Toshiyuki Tsutsumi (Meiji Univ.), Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo (Ehime Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.), Yuzo Takamatsu (Ehime Univ.) DC2008-16 |
With the shrinking process technologies and the use of copper process, open defects on interconnect wires, contacts and ... [more] |
DC2008-16 pp.29-34 |
DC |
2008-02-08 09:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Fault Diagnosis for Dyinamic Open Faults with Considering Adjacent Lines Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Syuhei Kadoyama, Tetsuya Watanabe, Yuzo Takamatsu (Ehime Univ.), Toshiyuki Tsutsumi, Kouji Yamazaki (Meiji Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ. of Tokushima) DC2007-68 |
In modern manufacturing technologies with the shrinking of manufacturing process, LSIs may have several metal interconne... [more] |
DC2007-68 pp.7-12 |