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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 7 of 7  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2020-11-20
11:30
Online Online [Invited Talk] Three-dimensional device simulation of Si IGBTs -- Investigation of physical models and comparisons with measurements --
Naoyuki Shigyo, Masahiro Watanabe, Kuniyuki Kakushima, Takuya Hoshii, Kazuyoshi Furukawa (Tokyo Tech), Akira Nakajima (AIST), Katsumi Satoh (Mitsubishi Electric), Tomoko Matsudai (Toshiba), Takuya Saraya, Toshihiko Takakura, Kazuo Itou, Munetoshi Fukui, Shinichi Suzuki, Kiyoshi Takeuchi (The Univ. of Tokyo), Hitoshi Wakabayashi, Iriya Muneta (Tokyo Tech), Shin-ichi Nishizawa (Kyushu Univ.), Kazuo Tsutsui (Tokyo Tech), Toshiro Hiramoto (The Univ. of Tokyo), Hiromichi Ohashi, Hiroshi Iwai (Tokyo Tech) SDM2020-30
 [more] SDM2020-30
pp.36-40
PRMU, IPSJ-CVIM 2020-03-16
17:00
Kyoto
(Cancelled but technical report was issued)
Fine-grained Image Recognition using Geo-spatial Concept Knowledge Graphs with Graph Convolutional Networks
Yuki Shigyo, Naoko Nitta, Kazuaki Nakamura, Noboru Babaguchi (Osaka Univ.) PRMU2019-83
(To be available after the conference date) [more] PRMU2019-83
pp.93-98
SDM 2019-11-08
13:30
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Three-dimensional accurate TCAD simulation of trench-gate Si-IGBTs
Masahiro Watanabe, Naoyuki Shigyo, Takuya Hoshii, Kazuyoshi Furukawa, Kuniyuki Kakushima (Tokyo Tech.), Katsumi Satoh (Mitsubishi Electric Corp.), Tomoko Matsudai (Toshiba Electronic Devices & Storage Corp.), Takuya Saraya, Toshihiko Takakura, Kazuo Itou, Munetoshi Fukui, Shinichi Suzuki, Kiyoshi Takeuchi (The University of Tokyo), Iriya Muneta, Hitoshi Wakabayashi (Tokyo Tech.), Akira Nakajima (AIST), Shin-ichi Nishizawa (Kyushu University, Kasuga), Kazuo Tsutsui (Tokyo Tech.), Toshiro Hiramoto (The University of Tokyo), Hiromichi Ohashi, Hiroshi Iwai (Tokyo Tech.) SDM2019-77
In this work, excellent agreement between 3D TCAD simulations and experimental current-voltage characteristics were obta... [more] SDM2019-77
pp.45-48
SDM, ICD, ITE-IST [detail] 2019-08-08
10:25
Hokkaido Hokkaido Univ., Graduate School /Faculty of Information Science and [Invited Lecture] 3300V Scaled IGBT Switched by 5V Gate Drive
Toshiro Hiramoto, Takuya Saraya, Kazuo Itou, Toshihiko Takakura, Munetoshi Fukui, Shinichi Suzuki, Kiyoshi Takeuchi (Univ. of Tokyo), Masanori Tsukuda (Green Electronics Research Inst.), Yohichiroh Numasawa (Meiji Univ,), Katsumi Satoh (Mitsubishi Electric Corp), Tomoko Matsudai (Toshiba Electronic Devices & Storage Corp.), Wataru Saito (Kyushu Univ.), Kuniyuki Kakushima, Takuya Hoshii, Kazuyoshi Furukawa, Masahiro Watanabe, Naoyuki Shigyo, Hitoshi Wakabayashi, Kazuo Tsutsui, Hiroshi Iwai (Tokyo Inst. of Technology), Atsushi Ogura (Meiji Univ.), Shin-ichi Nishizawa (Kyushu Univ.), Ichiro Omura (Kyushu Inst. of Tech.), Hiromichi Ohashi (Tokyo Inst. of Tech.) SDM2019-42 ICD2019-7
 [more] SDM2019-42 ICD2019-7
pp.31-34
SDM 2019-01-29
15:40
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Demonstration of 1200V Scaled IGBTs Driven by 5V Gate Voltage with Superiorly Low Switching Loss
Takuya Saraya, Kazuo Itou, Toshihiko Takakura, Munetoshi Fukui, Shinichi Suzuki, Kiyoshi Takeuchi (Univ. of Tokyo), Masanori Tsukuda (GRIK), Yohichiroh Numasawa (Meiji Univ.), Katsumi Satoh (Mitsubishi Electric), Tomoko Matsudai, Wataru Saito (Toshiba Electronic Devices & Storage), Kuniyuki Kakushima, Takuya Hoshii, Kazuyoshi Furukawa, Masahiro Watanabe, Naoyuki Shigyo, Kazuo Tsutsui, Hiroshi Iwai (Tokyo Tech), Atsushi Ogura (Meiji Univ.), Shin-ichi Nishizawa (Kyushu Univ.), Ichiro Omura (Kyushu Inst. of Tech.), Hiromichi Ohashi (Tokyo Tech), Toshiro Hiramoto (Univ. of Tokyo) SDM2018-90
Functional trench-gated 1200V-10A class Si-IGBTs, designed based on the scaling concept, were fabricated, and 5V gate vo... [more] SDM2018-90
pp.39-44
SDM 2014-11-06
13:00
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Device simulation -- More than 30 years in Toshiba's TCAD --
Naoyuki Shigyo (Toshiba) SDM2014-100
TCAD is one of important tools for designing a semiconductor device. As a virtual fabrication, TCAD contributes to reduc... [more] SDM2014-100
pp.25-30
EST, MWP, OPE, MW, EMT, IEE-EMT [detail] 2013-07-18
16:40
Hokkaido Wakkanai Synthesis Cultural Center [Invited Talk] Semiconductor devidce simulation -- Progress in technology for these 30 years --
Naoyuki Shigyo (Toshiba) MW2013-58 OPE2013-27 EST2013-22 MWP2013-17
(To be available after the conference date) [more] MW2013-58 OPE2013-27 EST2013-22 MWP2013-17
pp.71-76
 Results 1 - 7 of 7  /   
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