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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM |
2013-12-13 17:20 |
Nara |
NAIST |
Characterization of interface states in SiC MOS structures with various crystal faces by conductance method Seiya Nakazawa, Yuichiro Nanen, Jun Suda, Tsunenobu Kimoto (Kyoto Univ.) SDM2013-133 |
The author's group previously reported that there are two types of interface states (fast and slow state) in 4H-SiC (000... [more] |
SDM2013-133 pp.101-105 |
SDM |
2008-12-05 14:30 |
Kyoto |
Kyoto University, Katsura Campus, A1-001 |
Improved Performance of an SiC MOSFET by a Three-Dimensional Gate Structure Yuichiro Nanen, Hironori Yoshioka, Masato Noborio, Jun Suda, Tsunenobu Kimoto (Kyoto Univ) SDM2008-191 |
4H-SiC (0001) MOSFETs with a three-dimensional gate structure, which has side-wall channels on the {11-20} face have bee... [more] |
SDM2008-191 pp.37-41 |
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