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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| HWS | 2024-04-19 15:00 |
Tokyo | (Primary: On-site, Secondary: Online) |
 HWS2024-2 |
(To be available after the conference date) [more] | HWS2024-2 pp.3-7 |
| HWS | 2024-04-19 16:25 |
Tokyo | (Primary: On-site, Secondary: Online) |
Non-Destructive Hardware Trojan Inspection by Backside Near Infrared Imaging Junichi Sakamoto, Yohei Hori, Shinichi Kawamura (AIST), Yuichi Hayashi (NAIST), Makoto Nagata (KU) HWS2024-5 |
Hardware Trojan detection is a critical topic for maintaining the security of IC supply chain. Previous studies have rep... [more] | HWS2024-5 pp.18-23 |
| HWS | 2024-04-19 17:15 |
Tokyo | (Primary: On-site, Secondary: Online) |
Supply chain security of semiconductor chips and countermeasure design technologies Makoto Nagata (Kobe Univ.), Kazuki Monta (Secafy Co., Ltd.), Yuichi Hayashi (NAIST), Naofumi Homma (Tohoku Univ.) HWS2024-7 |
This report is dedicated to the threats and countermeasures of semiconductor supply chain security, regarding the authen... [more] | HWS2024-7 pp.30-33 |
| VLD, HWS, ICD | 2024-02-29 14:50 |
Okinawa | (Primary: On-site, Secondary: Online) |
VLD2023-115 HWS2023-75 ICD2023-104 |
(To be available after the conference date) [more] | VLD2023-115 HWS2023-75 ICD2023-104 pp.94-97 |
| EMCJ | 2023-11-24 16:15 |
Tokyo | Kikai-Shinko-Kaikan (Primary: On-site, Secondary: Online) |
Fundamental Study on the Influence of Frequency Multiplication Ratio of Phase-Locked loop on Fault Injection into Cryptographic Modules Hikaru Nishiyama, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2023-80 |
(To be available after the conference date) [more] | EMCJ2023-80 pp.46-50 |
| ICD, HWS | 2023-10-31 13:55 |
Mie | (Primary: On-site, Secondary: Online) |
Fundamental Study on Fault Analysis Based on Glitch Injection into Phase-Locked Loop Hikaru Nishiyama, Daisuke Fujimoto, Yuichi Hayashi (NAIST) HWS2023-55 ICD2023-34 |
(To be available after the conference date) [more] | HWS2023-55 ICD2023-34 pp.5-9 |
| MW, EMCJ, EST, IEE-EMC [detail] | 2023-10-19 10:50 |
Yamagata | Yamagata University (Primary: On-site, Secondary: Online) |
Fundamental Study of Side-Channel Analysis Focusing on Backscattering from Switching Regulators Taiki Kitazawa, Kaji Shugo, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2023-40 MW2023-94 EST2023-67 |
(To be available after the conference date) [more] | EMCJ2023-40 MW2023-94 EST2023-67 pp.28-31 |
| EMM, BioX, ISEC, SITE, ICSS, HWS, IPSJ-CSEC, IPSJ-SPT [detail] | 2023-07-24 15:20 |
Hokkaido | Hokkaido Jichiro Kaikan | Deep Learning-Based Side-Channel Analysis Considering the Effect of Noise and Transfer Characteristics on the Measurement Process Yoshiki Kitamura, Taiki Kitazawa, Yuichi Hayashi (NAIST) ISEC2023-18 SITE2023-12 BioX2023-21 HWS2023-18 ICSS2023-15 EMM2023-18 |
(To be available after the conference date) [more] | ISEC2023-18 SITE2023-12 BioX2023-21 HWS2023-18 ICSS2023-15 EMM2023-18 pp.25-29 |
| EMM, BioX, ISEC, SITE, ICSS, HWS, IPSJ-CSEC, IPSJ-SPT [detail] | 2023-07-25 10:20 |
Hokkaido | Hokkaido Jichiro Kaikan | Takayuki Kondo, Taiki Kitazawa, Shugo Kaji, Daisuke Fujimoto, Yuichi Hayashi (NAIST) ISEC2023-40 SITE2023-34 BioX2023-43 HWS2023-40 ICSS2023-37 EMM2023-40 |
(To be available after the conference date) [more] | ISEC2023-40 SITE2023-34 BioX2023-43 HWS2023-40 ICSS2023-37 EMM2023-40 pp.171-175 |
| EMCJ | 2023-06-09 12:50 |
Hokkaido | Otaru Chamber of Commerce & Industry (Primary: On-site, Secondary: Online) |
FDTD analysis using reverse engineering model of FR-4 Hayato Ide (NITNC), Taiki Kitazawa, Yuichi Hayashi (NAIST), Takashi Kasuga (NITNC) EMCJ2023-19 |
The communication speed of USB and HDMI connectors for external electronic devices mounted on information equipment has ... [more] | EMCJ2023-19 pp.36-41 |
| EMCJ | 2023-06-09 15:05 |
Hokkaido | Otaru Chamber of Commerce & Industry (Primary: On-site, Secondary: Online) |
Fundamental Investigation of Electromagnetic Analysis Attack Detection Based on Frequency Difference between Ring Oscillators Taichi Sato, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2023-25 |
An attack that measures the power consumption of an encryption circuit using an EM probe and acquires secret information... [more] | EMCJ2023-25 pp.66-69 |
| EMCJ | 2023-06-09 16:20 |
Hokkaido | Otaru Chamber of Commerce & Industry (Primary: On-site, Secondary: Online) |
Estimating Transmission Efficiency of Intentional Electromagnetic Interference Using Fault Occurrence Rate from Cryptographic Devices Hikaru Nishiyama, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2023-28 |
Fault injection attacks using intentional electromagnetic interference (IEMI) against cryptographic devices have become ... [more] | EMCJ2023-28 pp.82-86 |
| EMCJ, IEE-EMC, IEE-SPC | 2023-05-12 13:15 |
Okinawa | (Primary: On-site, Secondary: Online) |
Evaluating Transmission Efficiency Impact on Screen Reconstruction Accuracy for High-Resolution Displays Taiki Kitazawa, Yuichi Hayashi (NAIST) EMCJ2023-6 |
In TEMPEST attacks targeting high-resolution displays with divided screens, reconstructing screen information proves dif... [more] | EMCJ2023-6 pp.1-6 |
| HWS | 2023-04-14 13:45 |
Oita | (Primary: On-site, Secondary: Online) |
Fundamental Study on the effect of the Number of RNS Bases on the Side-channel Information Leakage from Modular Multiplier Daisuke Fujimoto, Rikuo Haga, Yuichi Hayashi (NAIST) HWS2023-2 |
In public-key cryptography, the Residue Number System (RNS) has been proposed as a hardware implementation approach that... [more] | HWS2023-2 pp.6-8 |
| HWS, VLD | 2023-03-04 10:25 |
Okinawa | (Primary: On-site, Secondary: Online) |
Fundamental study of distance spoofing attack against dToF lidar with interference mitigation function Midori Tomijima, Daisuke Fujimoto, Yuichi Hayashi (NAIST) VLD2022-116 HWS2022-87 |
In order to avoid interference with the spread of LiDAR, a simple mitigation method that changes the irradiation interva... [more] | VLD2022-116 HWS2022-87 pp.239-244 |
| HWS, VLD | 2023-03-04 13:30 |
Okinawa | (Primary: On-site, Secondary: Online) |
Threat of EM Information Leakage from Speakerphones Due to IEMI and Suppression Indexes for EMC Countermeasures Seiya Takano, Yuichi Hayashi (NAIST) VLD2022-120 HWS2022-91 |
Threats of causing forced electromagnetic information leakage by irradiating devices with electromagnetic waves have bee... [more] | VLD2022-120 HWS2022-91 pp.261-266 |
| EMCJ | 2023-01-27 13:30 |
Okayama | WASHU BLUE RESORT (Primary: On-site, Secondary: Online) |
Fundamental Study on Reconstruction of Sound Information from EM Leakage Focusing on Multiple Demodulation Methods Taiki Kitazawa, Seiya Takano, Yuichi Hayashi (NAIST) EMCJ2022-83 |
It has been reported that speakerphones used in remote work environments leak audio information through electromagnetic ... [more] | EMCJ2022-83 pp.60-65 |
| HWS, ICD | 2022-10-25 11:25 |
Shiga | (Primary: On-site, Secondary: Online) |
Fundamental Study on Randomness Evaluation of ERO-TRNG Using APD Keiichi Ozaki, Daisuke Fujimoto (NAIST), Saki Osuka, Shinichi Kawamura (AIST), Yuichi Hayashi (NAIST) HWS2022-33 ICD2022-25 |
Randomness evaluation of true random number generators (TRNGs) based on ring oscillators (ROs) requires an analysis of o... [more] | HWS2022-33 ICD2022-25 pp.17-22 |
| HWS, ICD | 2022-10-25 11:50 |
Shiga | (Primary: On-site, Secondary: Online) |
Optical Microscopic Observation of Semiconductor Devices toward Hardware Trojan Detection Hirofumi Sakane, Junichi Sakamoto, Shinichi Kawamura (AIST), Makoto Nagata (Kobe Univ.), Yuichi Hayashi (NAIST) HWS2022-34 ICD2022-26 |
In this paper we focus on detection of hardware Trojan (HT) in semiconductor devices under a scenario with following ste... [more] | HWS2022-34 ICD2022-26 pp.23-28 |
| HWS, ICD | 2022-10-25 14:15 |
Shiga | (Primary: On-site, Secondary: Online) |
An Estimation Method of the Irradiation Timing of an Attack Pulse for Distance Spoofing Attack Against Direct ToF LiDAR Midori Tomijima, Daisuke Fujimoto, Yuichi Hayashi (NAIST) HWS2022-37 ICD2022-29 |
Autonomous vehicles are equipped with numerous sensors, and the vehicle runs according to their measurements. Therefore,... [more] | HWS2022-37 ICD2022-29 pp.41-45 |
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