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Committee Date Time Place Paper Title / Authors Abstract Paper #
RECONF 2022-06-07
Ibaraki CCS, Univ. of Tsukuba
(Primary: On-site, Secondary: Online)
Development of Vehicles GPS Time Synchronized Vibration Measurement System for Bridge Health Monitoring
Masaaki Ono, Ryota Shin, Yukihiko Okada, Ryosuke Yamamoto (Univ. of Tsukuba) RECONF2022-12
(To be available after the conference date) [more] RECONF2022-12
IE, ITS, ITE-AIT, ITE-HI, ITE-ME, ITE-MMS, ITE-CE [detail] 2017-02-21
Hokkaido Hokkaido Univ. Measurement of Number of Vermin around a Cage
Tatsuki Inada, Akie Yagura, Yosuke Yamamoto, Saori Hamaguchi, Kazufumi Nakai, Nobuo Ezaki (NIT Toba), Naoto Yamabata (Mie PAR), Osamu Takahashi (ISE)
In recent years, damage to agricultural products by wild animals has become serious. Installing traps is the main method... [more]
ASN 2015-11-05
Tokyo NICT Koganei HQ IoT for Agriculture "e-kakashi"
Norio Yamaguchi, Takashi Togami, Kyosuke Yamamoto (PSSOL) ASN2015-58
 [more] ASN2015-58
ICD 2012-12-18
Tokyo Tokyo Tech Front A 65 nm Low-Power Adaptive-Coupling Redundant Flip-Flop
Masaki Masuda, Kanto Kubota, Ryosuke Yamamoto (KIT), Jun Furuta (Kyoto Univ.), Kazutoshi Kobayashi (KIT), Hidetoshi Onodera (Kyoto Univ.) ICD2012-117
We propose a low-power redundant flip-flop to be operated with high reliability over 1 GHz clock frequency based on the ... [more] ICD2012-117
MRIS, ITE-MMS 2012-10-19
Akita AIT [Invited Talk] 5Tb/in2 Bit Patterned Media Fabricated by a Directed Self-Assembling Polymer Mask
Yoshiyuki Kamata, Tomoyuki Maeda, Hiroyuki Hieda, Ryosuke Yamamoto, Naoko Kihara, Akira Kikitsu (Toshiba corp.) MR2012-25
FePt bit patterned media (BPM) was fabricated with a self-assembled polymer mask with 12 nm pitch (equivalent to 5 Tdot/... [more] MR2012-25
ICD 2011-12-16
Osaka   A 65-nm Radiation-Hard Flip-Flop Tolerant to Multiple Cell Upsets
Ryosuke Yamamoto, Chikara Hamanaka (Kyoto Inst. of Tech.), Jun Furuta (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Inst. of Tech.), Hidetoshi Onodera (Kyoto Univ.) ICD2011-129
MCUs in redundant FFs is a dominant factor in a current deep-submicron process. A layout structure to avoid MCUs is prop... [more] ICD2011-129
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