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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM, ED, CPM 2019-05-16
14:40
Shizuoka Shizuoka Univ. (Hamamatsu) Characterizations of lattice strain and optical properties for Ge layers epitaxially grown on bonded Si-on-Quartz substrate
Kyosuke Noguchi (Toyohashi Univ. Tech.), Michiharu Nishimura (Univ. Tokyo), Junji Matui, Yoshiyuki Tsusaka (Univ. Hyogo), Yasuhiko Ishikawa (Toyohashi Univ. Tech.) ED2019-14 CPM2019-5 SDM2019-12
Ge epitaxial layers on Si-on-insulator (SOI) wafer have been widely used for photodetectors operating in the C band (1.5... [more] ED2019-14 CPM2019-5 SDM2019-12
pp.21-24
SCE, MW 2006-04-20
10:50
Tokyo ISTEC-SRL (Shinonome) Surface resistance measurement of superconducting films in dc magnetic field using dielectric resonator at 38 GHz
Atsushi Saito, Yohei Taniguchi, Yosuke Noguchi, Shinya Takeda (Yamagata Univ.), Hirofumi Yamasaki, Yoshihiko Nakagawa (AIST), Satoru Hirano, Shigetoshi Ohshima (Yamagata Univ.)
The surface resistance (Rs) of superconducting thin films were measured by using a dielectric resonator method at 38 GHz... [more] SCE2006-5 MW2006-5
pp.25-28
MW, SCE 2005-04-27
15:50
Tokyo Kikai-Shinko-Kaikan Bldg. Dependence of surface resistance in high temperature superconducting thin films on magnitude and angle of applied DC magnetic field
Yosuke Noguchi, Kazuhiro Kitamura, Keiji Aizawa, Atsushi Saito, Satoru Hirano, Shigetoshi Ohshima (Yamagata Univ.)
We investigated the dependence of the surface resistance (R_{S}) in high-temperature superconductor (HTS) thin films on ... [more] SCE2005-9 MW2005-9
pp.45-49
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