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All Technical Committee Conferences  (All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 5件中 1~5件目  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD 2018-04-20
10:45
Tokyo   [Invited Lecture] A Dynamic Power Reduction in Synchronous 2RW 8T Dual-Port SRAM by Adjusting Wordline Pulse Timing with Same/Different Row Access Mode
Yoshisato Yokoyama, Yuichiro Ishii, Haruyuki Okuda, Koji Nii (REL) ICD2018-9
(To be available after the conference date) [more] ICD2018-9
pp.33-38
ICD 2016-04-14
10:10
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Lecture] A Cost Effective Test Screening Method on 40-nm 4-Mb Embedded SRAM for Low-power MCU
Yuta Yoshida (RSD), Yoshisato Yokoyama, Yuichiro Ishii (Renesas Electronics), Toshihiro Inada, Koji Tanaka, Miki Tanaka, Yoshiki Tsujihashi (RSD), Koji Nii (Renesas Electronics) ICD2016-1
An embedded single-port SRAM with cost effective test screening circuitry is demonstrated for low-power micr... [more] ICD2016-1
pp.1-6
SDM 2016-01-28
14:30
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] 2RW Dual-port SRAM Design Challenges in Advanced Technology Nodes
Koji Nii, Makoto Yabuuchi (Renesas), Yoshisato Yokoyama (Renesas System Design), Yuichiro Ishii, Takeshi Okagaki, Masao Morimoto, Yasumasa Tsukamoto (Renesas), Koji Tanaka, Miki Tanaka (Renesas System Design), Shinji Tanaka (Renesas) SDM2015-125
 [more] SDM2015-125
pp.21-25
ICD 2015-04-16
13:50
Nagano   [Invited Lecture] 40 nm Dual-port and Two-port SRAMs for Automotive MCU Applications under the Wide Temperature Range of -40 to 170℃ with Test Screening Against Write Disturb Issues
Yoshisato Yokoyama, Yuichiro Ishii, Tatsuya Fukuda, Yoshiki Tsujihashi, Atsushi Miyanishi (Renesas Electronics), Shinobu Asayama, Keiichi Maekawa, Kazutoshi Shiba (Renesas Semiconductor Manufacturing Corporation), Koji Nii (Renesas Electronics) ICD2015-3
(To be available after the conference date) [more] ICD2015-3
pp.9-14
ICD, SDM 2014-08-05
10:50
Hokkaido Hokkaido Univ., Multimedia Education Bldg. 40nm ultra-low leakage SRAM at 170 deg.C operation for embedded flash MCU
Yoshisato Yokoyama, Yuichiro Ishii, Hidemitsu Kojima, Atsushi Miyanishi, Yoshiki Tsujihashi, Shinobu Asayama, Kazutoshi Shiba, Koji Tanaka, Tatsuya Fukuda, Koji Nii, Kazumasa Yanagisawa (Renesas) SDM2014-74 ICD2014-43
(To be available after the conference date) [more] SDM2014-74 ICD2014-43
pp.65-70
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