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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 37  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2021-02-05
14:25
Online Online Fault Coverage Estimation Method in Multi-Cycle Testing
Norihiro Nakaoka, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas Electronics Corp.) DC2020-75
 [more] DC2020-75
pp.36-41
VLD, DC, RECONF, ICD, IPSJ-SLDM
(Joint) [detail]
2020-11-17
11:20
Online Online Control Point Selection Approach for Scan Pattern Reduction under Multi-cycle Test
Hikaru Tamaki, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) VLD2020-15 ICD2020-35 DC2020-35 RECONF2020-34
 [more] VLD2020-15 ICD2020-35 DC2020-35 RECONF2020-34
pp.24-29
DC 2020-02-26
10:50
Tokyo   A study on temperature dependence on discrimination of resistive opens using machine learning-based anomaly detection
Ryotaroh Nakanishi, Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.), Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) DC2019-88
 [more] DC2019-88
pp.13-18
VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2019-11-14
16:10
Ehime Ehime Prefecture Gender Equality Center Analysis of Fault Detection Degradation Issue in Multi-cycle Test Scheme using Probabilistic Evaluation Method
Norihiro Nakaoka, Tomoki Aono, Sohshi Kudoh, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) VLD2019-45 DC2019-69
In order to ensure the functional safety of advanced autonomous driving systems, a power-on self-test
(POST) is require... [more]
VLD2019-45 DC2019-69
pp.145-150
DC 2019-02-27
14:05
Tokyo Kikai-Shinko-Kaikan Bldg. FF Toggle Control Point Selection Methods for Fault Detection Enhancement under Multi-cycle Testing
Tomoki Aono, Hanan T.Al-Awadhi, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) DC2018-79
Multi-cycle Test is a promising way to reduce the test volume of Logic-BIST (Logic Built-in Self-Test) based POST (Power... [more] DC2018-79
pp.49-54
DC 2018-02-20
16:10
Tokyo Kikai-Shinko-Kaikan Bldg. Testing the Bridge Interconnect Fault for Memory based Reconfigurable Logic Device (MRLD)
Senling Wang, Tatsuya Ogawa, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Masayuki Sato, Mitsunori Katsu (TRL), Shoichi Sekiguchi (TAIYOYUDEN) DC2017-87
MRLD is a promising alternative to FPGA with the benefits of low production cost, low power and small delay. In order to... [more] DC2017-87
pp.61-66
SS, MSS 2018-01-18
15:45
Hiroshima   Study on Deployment of a Computer Algebra System for Generating Random Test Patterns for Combinational Circuits
Tsutomu Inamoto, Yoshinobu Higami (Ehime Univ.) MSS2017-57 SS2017-44
In this study, the authors display an attempt of deploying a computer algebra system to improve the fault detection rate... [more] MSS2017-57 SS2017-44
pp.59-64
ASN 2017-05-25
10:50
Tokyo Tokyo Univ. (Institute of Industrial Science) Multi-Platform Application to Report Marine Water Information for Prediction of Red Tide Occurrence
Keiichi Endo, Kazuya Kusuno, Takuya Fujihashi, Hisayasu Kuroda, Yoshinobu Higami, Shinya Kobayashi (Ehime Univ.) ASN2017-3
A red tide is a serious problem in culture industry because of the death or quality degradation of cultured fish.
In o... [more]
ASN2017-3
pp.13-18
DC 2017-02-21
11:35
Tokyo Kikai-Shinko-Kaikan Bldg. Built-In Self Diagnosis Architecture for Logic Design
Keisuke Kagawa, Fumiya Yano, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Satoshi Ohtake (Oita Univ.) DC2016-76
Recently, roles of automotive LSI to realize a functional safety of vehicle are increasing. In order to guarantee the fu... [more] DC2016-76
pp.11-16
DC 2016-02-17
10:50
Tokyo Kikai-Shinko-Kaikan Bldg. Reduction of open fault test pattern generation time by selection of adjacent lines for assigning logic value
Kazui Fujitnai, Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.), Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) DC2015-88
As semiconductor technology is scaling down, open defects have often occurred at interconnect lines and vias. If logic v... [more] DC2015-88
pp.13-18
DC 2016-02-17
15:15
Tokyo Kikai-Shinko-Kaikan Bldg. Analog Circuit Design for a Precision Resistance Measurement of TSVs
Senling Wang, Keisuke Kagawa (Ehime Univ.), Shuichi Kameyama (Fujitsu), Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) DC2015-94
 [more] DC2015-94
pp.49-54
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2015-12-01
14:40
Nagasaki Nagasaki Kinro Fukushi Kaikan On discrimination method of a resistive open using delay variation induced by signal transitions on adjacent lines
Kotaro Ise, Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.), Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) VLD2015-42 DC2015-38
The effect of a resistive open results in small delay in an IC. It is difficult to test small delay since signal delay a... [more] VLD2015-42 DC2015-38
pp.31-36
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2015-12-03
11:40
Nagasaki Nagasaki Kinro Fukushi Kaikan Implementation of Precision Resistance Measurement of TSVs Using Analog Boundary Scan
Senling Wang, Keisuke Kagawa (Ehime Univ.), Shuichi Kameyama (Fujitsu), Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) VLD2015-65 DC2015-61
 [more] VLD2015-65 DC2015-61
pp.177-182
MSS, CAS, IPSJ-AL [detail] 2015-11-21
14:35
Kagoshima Ibusuki CityHall Preliminary Study on the Trip-based Integer Linear Programming Model for Static Multi-car Elevator Operation Problems
Tsutomu Inamoto, Yoshinobu Higami (Ehime Univ.) CAS2015-60 MSS2015-34
In this study, we report some preliminary results to optimize operations for multi-car elevator systems. This study appr... [more] CAS2015-60 MSS2015-34
pp.129-134
DC 2015-02-13
16:25
Tokyo Kikai-Shinko-Kaikan Bldg A Simulated Annealing based Low IR Drop Pattern Selection Method for Resistive Open Fault Diagnosis
Senling Wang, Taiga Inoue, Hanan T.al-awadhi, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) DC2014-87
 [more] DC2014-87
pp.55-60
MSS 2014-03-06
16:45
Ehime Ehime Univ. A Numerical Study on Optimality of Elevator Operations by a Zoning Technique
Tsutomu Inamoto, Yoshinobu Higami, Shin-ya Kobayashi (Ehime Univ.) MSS2013-82
In this study, some preliminary results on optimality of elevator operations by a zoning technique are displayed.

Thi... [more]
MSS2013-82
pp.43-48
DC 2013-02-13
13:30
Tokyo Kikai-Shinko-Kaikan Bldg. Characteristic Analysis of Signal Delay for Resistive Open Fault Detection
Hiroto Ohguri, Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ. of Tokushima), Toshiyuki Tsutsumi, Koji Yamazaki (Meiji Univ.), Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) DC2012-84
When a resistive open fault occurs, signal delay at the faulty wire may degrade circuit performance. However, a resistiv... [more] DC2012-84
pp.25-30
DC 2012-06-22
14:20
Tokyo Room B3-1 Kikai-Shinko-Kaikan Bldg [Invited Talk] Empirical study for signal integrity-defects
Hiroshi Takahashi, Yoshinobu Higami (Ehime Univ.), Toshiyuki Tsutsumi, Koji Yamazaki (Meiji Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ. Tokushima) DC2012-12
We try to empirically study signal integrity-defects.
In this study, we analyze the resistive open fault that causes th... [more]
DC2012-12
pp.21-26
DC 2012-02-13
14:00
Tokyo Kikai-Shinko-Kaikan Bldg. A new problem at Boundary-Scan testing -- an internal disruption within IC during interconnect testing --
Shuichi Kameyama (Fujitsu & Ehime Univ.), Masayuki Baba (Fujitsu), Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) DC2011-81
The miniaturization of electronic products is causing printed circuit boards to progress in the direction of higher dens... [more] DC2011-81
pp.31-35
CS, NS, IN
(Joint)
2011-09-02
15:45
Miyagi Tohoku University Dynamic routing and wavelength assignment using signaling of backward reservation in multifiber WDM networks
Kouji Hirata, Dewiani, Yoshinobu Higami, Shin-ya Kobayashi (Ehime Univ.) NS2011-79
 [more] NS2011-79
pp.115-120
 Results 1 - 20 of 37  /  [Next]  
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