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Committee Date Time Place Paper Title / Authors Abstract Paper #
EMM, BioX, ISEC, SITE, ICSS, HWS, IPSJ-CSEC, IPSJ-SPT [detail] 2023-07-24
15:20		 Hokkaido Hokkaido Jichiro Kaikan Deep Learning-Based Side-Channel Analysis Considering the Effect of Noise and Transfer Characteristics on the Measurement Process
Yoshiki Kitamura, Taiki Kitazawa, Yuichi Hayashi (NAIST) ISEC2023-18 SITE2023-12 BioX2023-21 HWS2023-18 ICSS2023-15 EMM2023-18		 (To be available after the conference date) [more] ISEC2023-18 SITE2023-12 BioX2023-21 HWS2023-18 ICSS2023-15 EMM2023-18
pp.25-29
HWS 2022-04-26
13:55		 Tokyo AIST Tokyo Waterfront (Annex)
(Primary: On-site, Secondary: Online)		 Evaluation of Electromagnetic Information Leakage Intensity from Displays under Different Usage Environment
Yoshiki Kitamura, Taiki Kitazawa, Daisuke Fujimoto, Yuichi Hayahi (NAIST) HWS2022-5		 The threat of TEMPEST attack which reconstructs the screen information from the electromagnetic leakage caused by operat... [more] HWS2022-5
pp.24-27
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