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All Technical Committee Conferences (All Years)
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| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| RECONF |
2019-05-09
15:45 |
Tokyo |
Tokyo Tech Front |
Hideki Takase (Kyoto Univ./JST), Kentaro Matsui (Kyoto Univ.), Yoshihiro Ueno (Delight Systems), Masakazu Mori (karabiner.inc), Susumu Yamazaki (Univ. of Kitakyushu)  RECONF2019-7 |
(To be available after the conference date) [more] |
RECONF2019-7
pp.35-40 |
MBE, NC
(Joint) |
2017-03-14
13:35 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Development of microscopy system to optimize spherical aberration
Yoshihiro Ue (RIKEN/OLYMPUS), Hiromu Monai (RIKEN), Kaori Higuchi, Daisuke Nishiwaki, Tetuya Tajima, Kenya Okazaki (RIKEN/OLYMPUS), Hiroshi Hama, Hajime Hirase, Atsushi Miyawaki (RIKEN) NC2016-92 |
[more] |
NC2016-92
pp.165-170 |
MBE, NC
(Joint) |
2017-03-14
14:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Estimation of refractive index in the living brain by optimizing spherical aberration.
Hiromu Monai (RIKEN), Yoshihiro Ue, Kaori Higuchi, Daisuke Nishiwaki, Tetsuya Tajima, Kenya Okazaki (RIKEN/OLYMPUS), Hiroshi Hama, Hirase Hajime, Atsushi Miyawaki (RIKEN) NC2016-93 |
The high-resolution imaging of fine structures such as neurites requires objectives with high numerical apertures (NAs).... [more] |
NC2016-93
pp.171-176 |
| SDM |
2013-12-13
09:00 |
Nara |
NAIST |
Analysis of thermal-induced degradation in oxide thin-film transistor under pulse voltage stress
Kahori Kise (NAIST), Shigekazu Tomai (Idemitsu Kosan), Yoshihiro Ueoka, Haruka Yamazaki, Satoshi Urakawa (NAIST), Koki Yano (Idemitsu Kosan), Dapeng Wang, Mamoru Furuta (Kochi Univ. of Tech.), Masahiro Horita, Yasuaki Ishikawa, Yukiharu Uraoka (NAIST) SDM2013-116 |
In recent years, transparent amorphous oxide semiconductor (TAOS), represented by a-InGaZnO have been reported. Because ... [more] |
SDM2013-116
pp.1-5 |
| SDM |
2012-12-07
13:30 |
Kyoto |
Kyoto Univ. (Katsura) |
Theoretical Analysis of Degradation Phenomena in a-Oxide TFT by Device Simulation
Satoshi Urakawa, Yoshihiro Ueoka, Haruka Yamazaki, Yasuaki Ishikawa, Yukiharu Uraoka (NAIST) SDM2012-125 |
Transparent amorphous oxide semiconductor (TAOS) has attracted considerable attention as an alternative material for a-S... [more] |
SDM2012-125
pp.59-64 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail] |
2010-12-01
13:15 |
Fukuoka |
Kyushu University |
[Invited Talk]
Monolithic 3D-FPGA with TFT SRAM over 90nm 9 layer Cu CMOS
Tatasuya Naito, Tatsuya Ishida (Toshiba), Takeshi Onoduka (Covalent Materials), Masahito Nishigoori, Takeo Nakayama, Yoshihiro Ueno, Yasumi Ishimoto, Akihiro Suzuki, Chung Weicheng (Toshiba), Raminda Madurawe (readyASIC), Sheldon Wu (China International Intellectual Property Services), Shu Ikeda (tei Solutions), Hisato Oyamatsu (Toshiba) RECONF2010-50 |
[more] |
RECONF2010-50
pp.65-69 |
| ICD |
2010-04-22
13:30 |
Kanagawa |
Shonan Institute of Tech. |
[Invited Talk]
A 64Mbit MRAM with Clamped-Reference and Adequate-Reference Schemes
Kenji Tsuchida, Tsuneo Inaba, Katsuyuki Fujita, Yoshihiro Ueda, Takafumi Shimizu, Yoshiaki Asao, Takeshi Kajiyama, Masayoshi Iwayama, Sumio Ikegawa, Tatsuya Kishi, Tadashi Kai, Minoru Amano, Naoharu Shimomura, Hiroaki Yoda, Yohji Watanabe (TOSHIBA) ICD2010-7 |
A 64Mb spin-transfer-torque MRAM in 65nm CMOS is developed. 47mm2 die uses 0.3584um2 cell with the perpendicular-TMR dev... [more] |
ICD2010-7
pp.35-40 |
| MI |
2008-01-25
16:35 |
Okinawa |
Naha-Bunka-Tenbusu |
Reduction of Ring Artifacts in Cone-Beam CT images
Guifang Duan, Yen-Wei Chen (Ritsumeikan Univ.), Xian-Hua Han (Ritsumeikan Univ./Central South Univ. of Forestry & Tech.), Akinori Fujita, Ken Hirooka, Yoshihiro Ueno (Shimadzu) MI2007-105 |
Cone-beam CT (CBCT) scanners are based on volumetric tomography, using a 2D extended digital array providing an area det... [more] |
MI2007-105
pp.227-233 |
| ICD |
2007-04-12
09:30 |
Oita |
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Design of Low Read Bias Voltage and High Speed Sense Amplifier for STT-MRAM
Yoshihiro Ueda, Yoshihisa Iwata, Tsuneo Inaba, Yuui Shimizu, Kiyotaro Itagaki, Kenji Tsuchida (Toshiba) ICD2007-2 |
(To be available after the conference date) [more] |
ICD2007-2
pp.7-12 |
| ICD |
2006-04-14
09:55 |
Oita |
Oita University |
High Performance 16Mb MRAM for Portable Applications
Yuui Shimizu, Yoshihisa Iwata, Kenji Tsuchida, Tsuneo Inaba, Ryosuke Takizawa, Yoshihiro Ueda, Kiyotaro Itagaki, Yoshiaki Asao, Takeshi Kajiyama, Keiji Hosotani, Sumio Ikegawa, Tadashi Kai, Masahiko Nakayama, Hiroaki Yoda (Toshiba Co.) |
[more] |
ICD2006-13
pp.69-73 |
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