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Committee
Date Time
Place
Paper Title / Authors
Abstract
Paper #
VLD
,
ICD
,
DC
,
IPSJ-SLDM
2005-12-02
09:30
Fukuoka
Kitakyushu International Conference Center
On Low Capture Power Test Generation for Scan Testing
Tatsuya Suzuki
,
Xiaoqing Wen
,
Seiji Kajihara
(
K.I.T.
),
Kohei Miyase
,
Yoshihiro Minamoto
(
JST
)
High switching activity occurs when the response to a test vector is captured by flip-flops during scan testing. This ma...
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VLD2005-76
ICD2005-171
DC2005-53
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