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Committee Date Time Place Paper Title / Authors Abstract Paper #
R 2014-11-20
Osaka   Prediction of performance degradation and lifetime for semiconductor devices using markov chain model
Kai Momoda, Koichi Endo, Yoshihiro Midoh, Katsuyoshi Miura, Koji Nakamae (Osaka Univ.) R2014-61
We study on a method to predict performance degradation and lifetime of semiconductor devices under the assumption that ... [more] R2014-61
R 2011-05-13
Kochi Kochi City Culture-Plaza Cul-Port [Invited Talk] The combinational or selective usage of the laser SQUID microscope, the laser terahertz emission microscope, and related simulations -- Non-electrical-contact fault localization in LSI chips --
Kiyoshi Nikawa (Osaka Univ.), Masatsugu Yamashita (RIKEN), Toru Matsumoto (HPK), Katsuyoshi Miura, Yoshihiro Midoh, Koji Nakamae (Osaka Univ.) R2011-8
 [more] R2011-8
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