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Committee Date Time Place Paper Title / Authors Abstract Paper #
EE, IEE-HCA 2021-05-27
Online Online A Power Semiconductor Device Characterization Technique with Deep Learning Image Processing
Kosuke Matsumoto, Yoichi Isizuka (Nagasaki Univ.), Noritaka Shigei (Kagoshima Univ.), Takahiro Koga (ANSYS)
Okinawa Okinawa Industry Support Center [Special Talk] Assistance Technique for Ground Modeling with Wireless Sensor Network and AI
Yoichi Isizuka (Nagasaki Univ.)
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