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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD 2008-12-12
13:20
Tokyo Tokyo Inst. Tech., Ohokayama Campus, Kokusa-Kouryu-Kaikan Fast Voltage Control Scheme with Adaptive Voltage Control Steps and Temporary Reference Voltage Overshoots for Dynamic Voltage and Frequency Scaling
Yoshifumi Ikenaga, Masahiro Nomura (NEC Electronics), Yoetsu Nakazawa (NEC Corporation), Yoshihiro Hayashi (NEC Electronics) ICD2008-121
 [more] ICD2008-121
pp.95-100
ICD, SDM 2007-08-23
14:35
Hokkaido Kitami Institute of Technology An Optimal Supply Voltage Determiner Circuit for Minimum Energy Operations
Yoshifumi Ikenaga, Masahiro Nomura, Yoetsu Nakazawa, Yasuhiko Hagihara (NEC Corp.) SDM2007-151 ICD2007-79
 [more] SDM2007-151 ICD2007-79
pp.57-62
ICD, SDM 2005-08-18
14:55
Hokkaido HAKODATE KOKUSAI HOTEL Monitoring Scheme for Minimizing Power Consumption by Means of Supply and Threshold Voltage Control in Active and Standby Modes
Yoshifumi Ikenaga, Masahiro Nomura, Koichi Takeda, Yoetsu Nakazawa (NEC), Yoshiharu Aimoto (NECEL), Yasuhiko Hagihara (NEC)
(Advance abstract in Japanese is available) [more] SDM2005-139 ICD2005-78
pp.67-72
ICD 2005-04-14
09:00
Fukuoka   A Read-Static-Noise-Margin-Free SRAM cell for low-Vdd and High-speed applications
Koichi Takeda, Yasuhiko Hagihara (NEC), Yoshiharu Aimoto (NECEL), Masahiro Nomura, Yoetsu Nakazawa (NEC), Toshio Ishii, Hiroyuki Kobatake (NECEL)
A read-static-noise-margin-free SRAM cell consists of seven transistors, several of which are low-Vt NMOS transistors us... [more] ICD2005-1
pp.1-6
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