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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 17 of 17  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ 2019-05-10
Hyogo   Impedance Analysis of Brushless Motors by 3-D Electromagnetic Field Analysis and Equivalent Circuit Analysis
Yasuhiro Shiraki (Mitsubishi Electric) EMCJ2019-17
In power electric equipment, electromagnetic noise propagated via motors is a major factor in conductive noise. The cond... [more] EMCJ2019-17
(Joint) [detail]
Tokyo Kikai-Shinko-Kaikan Bldg. A Gasket-Free Electromagnetic Shielding Structure for 2.4 GHz and 5 GHz bands Using Dual-Behavior SIW Resonators
Satoshi Yoneda, Yasuhiro Shiraki, Yuichi Sasaki, Chiharu Miyazaki (Mitsubishi Electric) EMCJ2018-18 EMD2018-16
A gasket-free electromagnetic shielding structure for specific frequency band using cascaded substrate integrated wavegu... [more] EMCJ2018-18 EMD2018-16
Tokyo Kikai-Shinko-Kaikan Bldg. Inductance Analysis of Dual Mode Choke Considering Magnetic Saturation and Verification of Noise Reduction Effect
Yasuhiro Shiraki, Satoshi Yoneda, Katsuhiko Omae, Takashi Nagao (Mitsubishi Electric.) EMCJ2017-107
 [more] EMCJ2017-107
EMCJ 2016-03-11
Tokyo Kikai-Shinko-Kaikan Bldg. High Performance Broadband Noise Filter Using Inductance Cancellation Technique and Various Capacitors
Yasuhiro Shiraki, Naoto Oka, Yuichi Sasaki, Hideyuki Ohashi (Mitsubishi Elec.) EMCJ2015-131
In this paper, the broadband characteristics of the integrated noise filters by an inductance cancellation technique for... [more] EMCJ2015-131
EMCJ 2015-11-13
Kanagawa Mitsubishi Electric Corporation A Gasket-Free Electromagnetic Shielding Structure for 2.4 GHz band Using Folded-Quarterwavelength SIW Resonators
Satoshi Yoneda, Yasuhiro Shiraki, Yuichi Sasaki, Naoto Oka, Hideyuki Oh-hashi (Mitsubishi Electric) EMCJ2015-81
As wireless local area network (LAN) devices have been widely spread in past few years, a shielded room realizing shield... [more] EMCJ2015-81
EMCJ 2014-07-10
Tokyo Kikai-Shinko-Kaikan Bldg. Noise Suppression Effect by Three-Terminal Capacitors on Power Line for Digital Circuit Using
Akihito Kobayashi, Yasuhiro Shiraki, Yuichi Sasaki, Naoto Oka, Hideyuki Oh-hashi (Mitsubishi Electric) EMCJ2014-18
 [more] EMCJ2014-18
Saga Saga Univ. A GHz-band Electromagnetic Shielding Structure with Built-in Arrayed SIW Resonators
Satoshi Yoneda, Yasuhiro Shiraki, Yuichi Sasaki, Naoto Oka, Hideyuki Oh-hashi (Mitsubishi Electric) EMCJ2013-122
As operating frequency of electronic devices have become higher recently, electromagnetic noise over GHz frequency may b... [more] EMCJ2013-122
EMCJ 2013-09-13
Hokkaido Hokkaido Univ. Transmission Quantity Investigation for Substrate Integrated Waveguides on Shield Enclosure Apertures
Yasuhiro Shiraki, Naoto Oka, Yuichi Sasaki, Hideyuki Oh-hashi, Satoshi Yoneda (Mitsubishi Electric) EMCJ2013-50
We investigated a substrate integrated waveguide (SIW) resonators in order to suppress electromagnetic noise from apert... [more] EMCJ2013-50
EMCJ, ITE-BCT 2013-03-08
Tokyo Kikai-Shinko-Kaikan Bldg. Conductive Noise Analysis for Automobile Invertors by Equivalent Circuits
Yasuhiro Shiraki, Yuichi Sasaki, Naoto Oka (Mitsubishi Electric) EMCJ2012-126
Noise problems in electric automobile equipments become more serious of recent application of high speed switching. On t... [more] EMCJ2012-126
EMCJ 2012-09-07
Hokkaido Hkkaido Univ. Investigation of the mode conversion from the common-mode to normal-mode on a noise filter in power electronics applications
Mamoru Kamikura, Yuichiro Murata, Yasuhiro Shiraki, Akinori Nishizawa (Mitsubishi Electric Corp.) EMCJ2012-57
The noise mode conversion from the common-mode to the normal-mode can occur in power electronics applications because of... [more] EMCJ2012-57
LQE, CPM, EMD, OPE, R 2012-08-24
Miyagi Tohoku Univ. Fabrication of free-standing Si microring cavities with Ge quantum dots and characterization of their optical properties
Taichi Chiba, Xuejun Xu (Tokyo City Univ.), Noritaka Usami (Tohoku Univ.), Takuya Maruizumi, Yasuhiro Shiraki (Tokyo City Univ.) R2012-42 EMD2012-48 CPM2012-73 OPE2012-80 LQE2012-46
(To be available after the conference date) [more] R2012-42 EMD2012-48 CPM2012-73 OPE2012-80 LQE2012-46
SDM 2012-06-21
Aichi VBL, Nagoya Univ. Surface Segregation Behavior of B, Ga, Sb, and As Dopant Atoms on Ge(100) and Ge(111) Examined with a First-principles Method
Fumiya Iijima, Kentaro Sawano (TCU), Jiro Ushio (CRL), Takuya Maruizumi, Yasuhiro Shiraki (TCU) SDM2012-52
To understand surface segregation behaviour of B, Ga, As, and Sb dopant atoms on Ge (100) and Ge (111) surfaces, the pot... [more] SDM2012-52
SDM 2011-10-21
Miyagi Tohoku Univ. (Niche) [Invited Talk] Study of HfO2/Si/strained-Ge/SiGe using Angle Resolved x-ray Photoelectron Spectroscopy
Hiroshi Nohira, Arata Komatsu, Kentarou Nasu, Yusuke Hoshi, Toru Kurebayashi, Kentaro Sawano (Tokyo City Univ.), M. Myronov (Univ. of Warwick), Yasuhiro Shiraki (Tokyo City Univ.) SDM2011-103
We have investigated the influence of Si-cap layer and the post deposition annealing (PDA) on compositional depth profil... [more] SDM2011-103
EMCJ, EMD 2008-07-18
Tokyo Kikai-Shinko-Kaikan Bldg Immunity Estimation for Printed Circuit Boards to Electrostatic Discharge by Circuit Simulation and Conducted Immunity Measurement of ICs
Yasuhiro Shiraki (Mitsubishi Elec. Corp.) EMCJ2008-43 EMD2008-25
Abstract The author proposed a hybrid method as ESD estimation technique at design stage. It consists of a conducted im... [more] EMCJ2008-43 EMD2008-25
ED, SDM 2007-06-25
Overseas Commodore Hotel Gyeongju Chosun, Gyeongju, Korea [Invited Talk] Silicon Photonic Devices with Ge Quantum Dots as Light Source
Yasuhiro Shiraki, Jinsong XIA (Musashi Inst. Tech.)
EMCJ, MW 2006-10-26
Aomori Hachinohe Institute of Technology Moments Analysis of EM Noise caused by Power/Ground Noise of Electric Unit
Yasuhiro Shiraki, Yasuhiro Yamanaka, Norio Abe (Mitsubishi Elec.) EMCJ2006-53 MW2006-109
In this paper, EM radiation(EMI) due to power and ground fluctuation of electric unit at FM band were investigated usin... [more] EMCJ2006-53 MW2006-109
EMCJ, EMD 2005-07-29
Tokyo Kikai-Shinko-Kaikan Bldg. Electromagnetic Analysis for Nuisance action of Electric Unit caused by Electromagnetic noise
Yasuhiro Shiraki (Mitsubishi Electric Corp.)
The radiated electromagnetic noise is a major source of malfunction to electric units. In the IEC61000-4-3, the measurem... [more] EMCJ2005-53 EMD2005-32
 Results 1 - 17 of 17  /   
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