IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 30  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2022-03-01
14:20
Tokyo Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online)
Evaluation of Efficiency for a Method to Locate High Power Consumption with Switching Provability
Ryu Hoshino, Taiki Utsunomiya, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara (Kyutech)
In recent years, as the high speed and miniaturization of LSIs have improved, it has become more difficult to test LSIs.... [more] DC2021-73
pp.51-56
DC 2021-02-05
11:35
Online Online A Novel High Performance Scan-Test-Aware Hardened Latch Design
Ruijun Ma, Stefan Holst, Xiaoqing Wen (KIT), Aibin Yan (AHU), Hui Xu (AUST) DC2020-71
As modern technology nodes become more and more susceptible to soft-errors, many radiation hardened latch designs have b... [more] DC2020-71
pp.12-17
DC 2021-02-05
12:00
Online Online Locating High Power Consuming Area in Logic parts Caused by Memory Size and Shapes
Daiki Takafuji, Ryu Hoshino, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2020-72
 [more] DC2020-72
pp.18-23
VLD, DC, RECONF, ICD, IPSJ-SLDM
(Joint) [detail]
2020-11-17
10:30
Online Online Power Analysis Based on Probability Calculation of Small Regions in LSI
Ryo Oba, Ryu Hoshino, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara (Kyutech) VLD2020-13 ICD2020-33 DC2020-33 RECONF2020-32
Power consumption in LSI testing is higher than in functional mode since more switching activities occur. High power con... [more] VLD2020-13 ICD2020-33 DC2020-33 RECONF2020-32
pp.12-17
DC 2020-02-26
14:35
Tokyo   Power Analysis for Logic Area of LSI Including Memory Area
Yuya Kodama, Kohei Miyase, Daiki Takafuji, Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2019-93
Power consumption during LSI testing is higher than functional mode. Excessive IR-drop causes excessive delay, resulting... [more] DC2019-93
pp.43-48
DC 2020-02-26
15:00
Tokyo   Improving Controllability of Signal Transitions in the High Switching Area of LSI
Jie Shi, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2019-94
Power consumption in LSI testing is larger than in functional mode. High power consumption causes excessive IR-drop and ... [more] DC2019-94
pp.49-54
DC 2019-02-27
10:15
Tokyo Kikai-Shinko-Kaikan Bldg. Analysis of the hotspot distribution in the LSI
Yudai Kawano, Kohei Miyase (Kyutech), Shyue-Kung Lu (NTUST), Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2018-74
Performance degrading caused by high IR-drop in normal functional mode of LSI can be solved by improving power supply ne... [more] DC2018-74
pp.19-24
DC 2018-02-20
11:00
Tokyo Kikai-Shinko-Kaikan Bldg. Locating Hot Spots with Justification Techniques in a Layout Design
Yudai Kawano, Kohei Miyase, Seiji Kajihara, Xiaoqing Wen (Kyutech) DC2017-80
In general, power consumption during LSI testing is higher than functional operation. Excessive power consumption in at-... [more] DC2017-80
pp.19-24
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2017-11-07
09:25
Kumamoto Kumamoto-Kenminkouryukan Parea On Avoiding Test Data Corruption by Optimal Scan Chain Grouping
Yucong Zhang, Stefan Holst, Xiaoqing Wen, Kohei Miyase, Seiji Kajihara (KIT), Jun Qian (AMD) VLD2017-42 DC2017-48
Scan shift operations cause many gates to switch simultaneously. As a result, excessive IR-drop may occur, disrupting th... [more] VLD2017-42 DC2017-48
pp.91-94
DC 2017-02-21
10:55
Tokyo Kikai-Shinko-Kaikan Bldg. IR-Drop Analysis on Different Power Supply Network Designs
Kohei Miyase, Kiichi Hamasaki (Kyutech), Matthias Sauer (University of Freiburg), Ilia Polian (University of Passau), Bernd Becker (University of Freiburg), Xiaoqing Wen, Seiji kajihara (Kyutech) DC2016-75
The shrinking feature size and low power design of LSI make LSI testing very difficult. Further development of LSI techn... [more] DC2016-75
pp.7-10
DC 2016-02-17
10:25
Tokyo Kikai-Shinko-Kaikan Bldg. Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation
Fuqiang Li, Xiaoqing Wen, Stefan Holst, Kohei Miyase, Seiji Kajihara (Kyutech) DC2015-87
Both logic paths and clock paths are subject to the impact of IR-Drop which occurs in capture mode during scan test. Thi... [more] DC2015-87
pp.7-12
DC 2015-06-16
15:00
Tokyo Kikai-Shinko-Kaikan Bldg. A Method to Identify High Test Power Areas in Layout Design
Kohei Miyase (Kyutech), Matthias Sauer, Bernd Becker (Univ. Freiburg), Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2015-18
The problems related to power consumption during at-speed testing is becoming more serious. Particularly, excessive peak... [more] DC2015-18
pp.13-18
DC 2014-06-20
14:05
Tokyo Kikai-Shinko-Kaikan Bldg. A X-Filling Method for Low-Capture-Power Scan Test Generation
Fuqiang Li, Xiaoqing Wen, Kohei Miyase, Stefan Holst, Seiji Kajihara (Kyushu Inst. of Tech.) DC2014-12
In order to generate a low capture power test pattern, we propose an
X-filling method to suppress local switching activ... [more]
DC2014-12
pp.15-20
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2012-11-28
16:00
Fukuoka Centennial Hall Kyushu University School of Medicine A Method to Estimate the Number of Don't-Care Bits with Netlist
Kohei Miyase, Seiji Kajihara, Xiaoqing Wen (KIT) VLD2012-104 DC2012-70
X-filling is often utilized so as to achieve test compression, test power reduction, or test quality improvement etc.
i... [more]
VLD2012-104 DC2012-70
pp.261-266
DC 2012-02-13
11:05
Tokyo Kikai-Shinko-Kaikan Bldg. Pattern Merging for Additional Path Delay Fault Detection with Transition Delay Fault Test
Hiroaki Tanaka, Kohei Miyase, Kazunari Enokimoto, Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2011-78
In this paper, we present to generate a test vector set to detect both transition and path delay faults. The proposed me... [more] DC2011-78
pp.13-18
DC 2011-06-24
16:20
Tokyo Kikai-Shinko-Kaikan Bldg. Low Power At-Speed Scan Testing for LOS Scheme by Test Vector Modification
Kohei Miyase, Yuta Uchinodan, Kazunari Enokimoto (KIT), Yuta Yamato (NAIST), Xiaoqing Wen, Seiji Kajihara (KIT), Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Arnaud Verazel (Lirmm) DC2011-13
In this paper, we present a test vector modification method to reduce launch-to-capture power for LOS scheme. The propos... [more] DC2011-13
pp.29-34
DC 2011-02-14
10:25
Tokyo Kikai-Shinko-Kaikan Bldg. Capture-Safety Checking Based on Transition-Time-Relation for At-Speed Scan Test Vectors
Ryota Sakai, Kohei Miyase, Xiaoqing Wen (Kyushu Inst. of Tech.), Masao Aso, Hiroshi Furukawa (RMS), Yuta Yamato (Fukuoka Ind. Sci & Tech/Fundation FIST), Seiji Kajihara (Kyushu Inst. of Tech.) DC2010-60
Excessive capture power in at-speed scan testing may cause timing failures, resulting in test-induced yield loss. This h... [more] DC2010-60
pp.7-12
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2010-11-29
16:05
Fukuoka Kyushu University Rotating Test and Pattern Partitioning for Field Test
Senling Wang, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen (Kyushu Insti. Tech.)
 [more]
DC 2010-02-15
14:10
Tokyo Kikai-Shinko-Kaikan Bldg. On Calculation of Delay Test Quality for Test Cubes and X-filling
Shinji Oku, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen (Kyushu Inst. of Tech./JTS) DC2009-73
This paper proposes a method to compute delay values in 3-valued fault simulation for test cubes which are test patterns... [more] DC2009-73
pp.51-56
DC 2010-02-15
15:40
Tokyo Kikai-Shinko-Kaikan Bldg. High Speed X-Fault Diagnosis with Partial X-Resolution
Kohei Miyase (Kyushu Inst. of Tech.), Yusuke Nakamura (Panasonic Communications Software Co.,Ltd.), Yuta Yamato, Xiaoqing Wen, Seiji Kajihara (Kyushu Inst. of Tech.) DC2009-76
Defects behavior of ultra small size and high speed LSI is getting complicated. It makes localization of fault site and ... [more] DC2009-76
pp.69-74
 Results 1 - 20 of 30  /  [Next]  
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan