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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMCJ |
2013-04-12 14:35 |
Okayama |
Okayama Univ. |
Influence of radio wave absorber performance to test result deviation between full anechoic room and semi-anechoic room. Keita Nagaoka, Nobuo Kuwabara (Kyushu Inst. of Tech.), Hidenori Muramatsu, Toshiki Shimasaki (VCCI) EMCJ2013-6 |
A full anechoic room (FAR) is investigated as the test facility which is used for the radiated emission tests from the i... [more] |
EMCJ2013-6 pp.31-36 |
EMCJ |
2013-01-10 16:25 |
Nagasaki |
Nagasaki Univ. |
Investigation of Correlation between Disturbance Current from Module Devices and Radiating Field Strength from Cable Kenich Yano, Nobuo Kuwabara (KIT), Toshiki Shimasaki (NEC-E), Hidenori Muramatsu (VCCI), Kengo Mori (I-O DATA) EMCJ2012-113 |
[more] |
EMCJ2012-113 pp.63-68 |
EMCJ (2nd) |
2012-11-29 14:30 |
Tokyo |
NICT |
Influence to Measurement Level by Difference of Measurement Circuit Yoshihiko Abe, Nobuo Kuwabara (KIT), Hidenori Muramatsu (VCCI), Toshiki Shimasaki (NEC Engineering, Ltd.) |
Influence to measurement level was evaluated by using three types of measurement circuit(called test board). The ratio o... [more] |
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EMCJ, EMD |
2012-07-20 15:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Study of correlation between kit-module level and electric field strength by using SO-DIMM evaluation model Nobuo Kuwabara (KIT), Hirokazu Tohya (ICAST), Hidenori Muramatsu (VCCI), Kengo Mori (I-O DATA DEVIC), Toshiki Shimasaki (NEC Engineering) EMCJ2012-47 EMD2012-22 |
[more] |
EMCJ2012-47 EMD2012-22 pp.37-42 |
EMCJ |
2012-01-27 09:05 |
Fukuoka |
Kyushu Univ. |
Current distribution analysis by FDTD method for measurement circuit of kit-module above 1GHz Yoshihiko Abe, Nobuo Kuwabara (KIT), Hidenori Muramatsu (VCCI), Toshiki Shimasaki (NEC-E) EMCJ2011-111 |
The method of evaluating disturbances from the kit-modules, such as a ha
rd disk and a memory, has been proposed and is... [more] |
EMCJ2011-111 pp.1-6 |
EMCJ |
2004-10-01 09:55 |
Nara |
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A miniature magnetic field probe by using precise multilayer LTCC substrate and its application for measuring high-frequency current Norio Masuda (NEC), Katsuji Kobayashi, Toshiki Shimasaki (NEC Engineering) |
[more] |
EMCJ2004-57 pp.13-16 |
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