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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 6 of 6  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ 2013-04-12
14:35
Okayama Okayama Univ. Influence of radio wave absorber performance to test result deviation between full anechoic room and semi-anechoic room.
Keita Nagaoka, Nobuo Kuwabara (Kyushu Inst. of Tech.), Hidenori Muramatsu, Toshiki Shimasaki (VCCI) EMCJ2013-6
A full anechoic room (FAR) is investigated as the test facility which is used for the radiated emission tests from the i... [more] EMCJ2013-6
pp.31-36
EMCJ 2013-01-10
16:25
Nagasaki Nagasaki Univ. Investigation of Correlation between Disturbance Current from Module Devices and Radiating Field Strength from Cable
Kenich Yano, Nobuo Kuwabara (KIT), Toshiki Shimasaki (NEC-E), Hidenori Muramatsu (VCCI), Kengo Mori (I-O DATA) EMCJ2012-113
 [more] EMCJ2012-113
pp.63-68
EMCJ
(2nd)
2012-11-29
14:30
Tokyo NICT Influence to Measurement Level by Difference of Measurement Circuit
Yoshihiko Abe, Nobuo Kuwabara (KIT), Hidenori Muramatsu (VCCI), Toshiki Shimasaki (NEC Engineering, Ltd.)
Influence to measurement level was evaluated by using three types of measurement circuit(called test board). The ratio o... [more]
EMCJ, EMD 2012-07-20
15:30
Tokyo Kikai-Shinko-Kaikan Bldg. Study of correlation between kit-module level and electric field strength by using SO-DIMM evaluation model
Nobuo Kuwabara (KIT), Hirokazu Tohya (ICAST), Hidenori Muramatsu (VCCI), Kengo Mori (I-O DATA DEVIC), Toshiki Shimasaki (NEC Engineering) EMCJ2012-47 EMD2012-22
 [more] EMCJ2012-47 EMD2012-22
pp.37-42
EMCJ 2012-01-27
09:05
Fukuoka Kyushu Univ. Current distribution analysis by FDTD method for measurement circuit of kit-module above 1GHz
Yoshihiko Abe, Nobuo Kuwabara (KIT), Hidenori Muramatsu (VCCI), Toshiki Shimasaki (NEC-E) EMCJ2011-111
The method of evaluating disturbances from the kit-modules, such as a ha
rd disk and a memory, has been proposed and is... [more]
EMCJ2011-111
pp.1-6
EMCJ 2004-10-01
09:55
Nara   A miniature magnetic field probe by using precise multilayer LTCC substrate and its application for measuring high-frequency current
Norio Masuda (NEC), Katsuji Kobayashi, Toshiki Shimasaki (NEC Engineering)
 [more] EMCJ2004-57
pp.13-16
 Results 1 - 6 of 6  /   
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