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Committee Date Time Place Paper Title / Authors Abstract Paper #
Tokyo Kikai-Shinko-Kaikan Bldg. Noise Evaluation Method for EEG Measurement System
Misaki Inaoka, Shintaro Izumi, Shusuke Yoshimoto, Toshikazu Nezu, Yuki Noda, Teppei Araki, Takafumi Uemura, Tsuyoshi Sekitani (Osaka Univ.) MICT2018-72
A test equipment that can evaluate the contact resistance and amount of noise of EEG sensors is proposed in this study. ... [more] MICT2018-72
ICD, SDM, ITE-IST [detail] 2016-08-02
Osaka Central Electric Club [Invited Talk] Patch-type EEG System with Stretchable Electrode Sheet for Medical Application
Shusuke Yoshimoto, Teppei Araki, Takafumi Uemura, Toshikazu Nezu, Masaya Kondo (Osaka Univ.), Kenichi Sasai (Panasonic), Masayuki Iwase, Hideki Satake, Akio Yoshida (Mektron), Mitsuru Kikuchi (Kanazawa Univ.), Tsuyoshi Sekitani (Osaka Univ.) SDM2016-56 ICD2016-24
 [more] SDM2016-56 ICD2016-24
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