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Kyoto   A Study on Leaked Electromagnetic Field Strength Variation Caused by Load Disturbance of Wireless Power Transfer System -- Comparison at Several Types of Driving Circuit of Primary Side --
Shinichi Taniguchi, Toshihiro Nagayama, Yoshihiro Kanasaki, Hironobu Watanabe, Hiroyuki Uno, Tetsuya Kaneko, Yutaka Saito (Panasonic System Networks R&D Lab.) WPT2015-40
Since the electromagnetic field leaked from the wireless power transfer (WPT) system interferes with the other devices, ... [more] WPT2015-40
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