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 Results 1 - 6 of 6  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
NS, IN
(Joint)		 2024-02-29
09:45		 Okinawa Okinawa Convention Center Performance Comparison of Raspbian and LineageOS on Raspberry Pi Hardware
Toshihiro Matsuda, Kien Nguyen, Hiroo Sekiya (Chiba Univ.) NS2023-191		 In recent years, there has been a proliferation of IoT applications, including smart homes, smart agriculture, and smart... [more] NS2023-191
pp.113-118
EE, IEE-SPC 2022-07-15
09:40		 Aichi WINC AICHI
(Primary: On-site, Secondary: Online)		 Maximum efficiency tracking for Wireless Power Transfer with Multiple Receivers
Toshihiro Matsuda, Yutaro Komiyama, Wenqi Zhu, Nguyen Kien, Hiroo Sekiya (Chiba Univ.) EE2022-12		 This paper proposes a pre-post regulation for a multi-receiver WPT system and presents a design guideline for a multi-re... [more] EE2022-12
pp.22-26
EA 2009-10-22
09:40		 Niigata   A study on out-of-head sound localization with several kinds of high accuracy sound stereo insert earphones
Toshihiro Matsuda, Masataka Yoshida, Haruhide Hokari, Shoji Shimada (Nagaoka Univ. of Tech.) EA2009-57		 In this report, the impact of Ear Canal Transfer Function (ECTF)
equalization on out-of-head sound localization with st... [more]		 EA2009-57
pp.7-12
ICD, SDM 2007-08-24
11:35		 Hokkaido Kitami Institute of Technology An analysis of asymmetry and orientation dependence of n-MOSFETs
Toshihiro Matsuda, Yuya Sugiyama, Hideyuki Iwata (Toyama Pref. Univ.), Takashi Ohzone (Okayama Pref. Univ.) SDM2007-161 ICD2007-89		 n-MOSFETs with 8 different channel orientation and three kinds of process conditions were measured and symmetry of IDsat... [more] SDM2007-161 ICD2007-89
pp.113-116
ICD, SDM 2006-08-18
09:00		 Hokkaido Hokkaido University A Test Structure to Separately Analyze CMOSFET Reliabilities along The Channel Width
Takashi Ohzone, Eiji Ishii, Takayuki Morishita, Kiyotaka Komoku (Okayama Pref. Univ.), Toshihiro Matsuda, Hideyuki Iwata (Toyama Pref. Univ.) 		A test structure with four kinds of MOSFETs(i.e., [A]([D]) with a short(long) channel-length all over the channel width,... [more] SDM2006-142 ICD2006-96
pp.99-104
ICD, SDM 2005-08-18
13:50		 Hokkaido HAKODATE KOKUSAI HOTEL A Test Structure to Analyze (Highly-Doped)/(Lightly-Doped)-Drain in LDD-type CMOSFET
Takashi Ohzone (Okayama Pref. Univ.), Toshihiro Matsuda (Toyama Pref. Univ.), Kazuhiko Okada, Takayuki Morishita, Kiyotaka Komoku (Okayama Pref. Univ.), Hideyuki Iwata (Toyama Pref. Univ.) 		A test structure to separately measure sheet resistances of highly-doped-drain (HDD) and lightly- doped-drain (LDD) in L... [more] SDM2005-137 ICD2005-76
pp.55-60
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