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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD, SDM |
2014-08-04 11:15 |
Hokkaido |
Hokkaido Univ., Multimedia Education Bldg. |
Testability Improvement for 12.8 GB/s Wide IO DRAM Controller with Small Area Prebonding TSV test and 1GHz Sampled Fully Digital Noise Monitor Takao Nomura, Ryo Mori, Koji Takayanagi, Toshihiko Ochiai, Kazuki Fukuoka, Tsuyoshi Kida, Koji Nii, Sadayuki Morita (REL) SDM2014-65 ICD2014-34 |
We developed a Wide IO DRAM controller chip with Through Silicon Via (TSV) technology. Test circuitry is embedded in the... [more] |
SDM2014-65 ICD2014-34 pp.17-21 |
ICD, ITE-CE |
2006-12-15 11:15 |
Hiroshima |
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Low Power SOC Design using Partial-Trench-Isolation ABC SOI for sub-100-nm LSTP technology Osamu Ozawa, Kazuki Fukuoka, Yasuto Igarashi, Takashi Kuraishi, Yoshihiko Yasu, Yukio Maki, Takashi Ipposhi, Toshihiko Ochiai, Masayoshi Shirahata, Koichiro Ishibashi (Renesas) |
[more] |
ICD2006-163 pp.115-119 |
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