IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 19 of 19  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
CPM, ED, LQE 2022-11-24
16:25
Aichi Winc Aichi (Aichi Industry & Labor Center)
(Primary: On-site, Secondary: Online)
Effects of AlN/AlGaN interfacial control layers in AlN/AlGaN/GaN MIS devices
Yuchen Deng, Hibiki Anaba, Hideyuki Matsuyama, Toshi-kazu Suzuki (JAIST) ED2022-39 CPM2022-64 LQE2022-72
 [more] ED2022-39 CPM2022-64 LQE2022-72
pp.69-72
SDM, ED, CPM 2022-05-27
17:05
Online Online Characterization method of semiconductors under Ohmic-metals by using multi-probe Hall devices
Kazuya Uryu (JAIST/ATL), Shota Kiuchi (JAIST), Taku Sato (ATL), Toshi-kazu Suzuki (JAIST) ED2022-15 CPM2022-9 SDM2022-22
(To be available after the conference date) [more] ED2022-15 CPM2022-9 SDM2022-22
pp.35-38
ED, CPM, LQE 2021-11-26
13:50
Online Online Interface charge engineering in normally-off AlTiO/AlGaN/GaN field-effect transistors
Duong Dai Nguyen, Takehiro Isoda, Yuchen Deng, Toshi-kazu Suzuki (JAIST) ED2021-30 CPM2021-64 LQE2021-42
 [more] ED2021-30 CPM2021-64 LQE2021-42
pp.71-74
ED 2016-07-23
14:25
Tokyo Tokyo Metropolitan Univ. Minami-Osawa Campus, International House Lorentzian low-frequency noise in AlTiO/AlGaN/GaN metal-insulator-semiconductor devices
Toshi-kazu Suzuki, Son Phuong Le, Toshimasa Ui, Tuan Quy Nguyen, Hong-An Shih (JAIST) ED2016-28
 [more] ED2016-28
pp.5-9
ED 2015-07-24
14:30
Ishikawa IT Business Plaza Musashi 5F Low-frequency noise in AlN/AlGaN/GaN metal-insulator-semiconductor devices
Toshi-kazu Suzuki, Son Phuong Le, Tuan Quy Nguyen, Hong-An Shih (JAIST) ED2015-39
 [more] ED2015-39
pp.15-20
ED 2013-08-08
15:30
Toyama University of Toyama [Invited Talk] Analysis of GaN-based metal-insulator-semiconductor devices by capacitance-frequency-temperature mapping
Toshi-kazu Suzuki, Hong-An Shih, Masahiro Kudo (JAIST) ED2013-40
 [more] ED2013-40
pp.15-18
ED 2013-08-08
16:20
Toyama University of Toyama Application of sputtering-deposited BN films to AlGaN/GaN metal-insulator-semiconductor heterojunction field-effect transistors
Yuji Yamamoto, Tuan Quy Nguyen, Hong-An Shih, Masahiro Kudo, Toshi-kazu Suzuki (JAIST) ED2013-41
 [more] ED2013-41
pp.19-23
LQE, OPE 2013-06-21
14:00
Tokyo   GHz Response of Metamorphic InAlAs MSM Photodetector on GaAs Substrate
Kazuaki Maekita, Takeo Maruyama, Koichi Iiyama (Kanazawa Univ.), Toshi-kazu Suzuki (JAIST) OPE2013-10 LQE2013-20
We fabricated metal-semiconductor-metal (MSM) photodetectors on metamorphic InAlAs layer grown on GaAs substrate. The de... [more] OPE2013-10 LQE2013-20
pp.19-22
ED 2012-07-26
14:20
Fukui Fukui University Temperature dependence of frequency dispersion in $C$-$V$ characteristics of AlN/AlGaN/GaN MIS-HFET
Hong-An Shih, Masahiro Kudo, Toshi-kazu Suzuki (JAIST) ED2012-43
 [more] ED2012-43
pp.11-15
ED 2011-07-29
14:20
Niigata Multimedia system center, Nagaoka Univ. of Tech. Characterization of sputtered AlN amorphous films and their applications to AlGaN/GaN MIS-HFET
Hong-An Shih, Masahiro Kudo, Masashi Akabori, Toshi-kazu Suzuki (JAIST) ED2011-39
 [more] ED2011-39
pp.13-16
ED 2011-07-29
15:45
Niigata Multimedia system center, Nagaoka Univ. of Tech. Effects of surface pre-treatments for AlN sputtering and Al2O3 atomic layer depositions on GaAs(001)
Masahiro Kudo, Hong-An Shih, Masashi Akabori, Toshi-kazu Suzuki (JAIST) ED2011-42
 [more] ED2011-42
pp.25-30
ED 2010-06-17
13:25
Ishikawa JAIST Fabrication and characterization of InAs ultra-thin films on flexible substrates
Hayato Takita, Norihiko Hashimoto, Masahiro Kudo, Masashi Akabori, Toshi-kazu Suzuki (JAIST) ED2010-34
(To be available after the conference date) [more] ED2010-34
pp.5-9
ED 2010-06-17
14:25
Ishikawa JAIST Analysis of electron velocity reduction rate due to self-heating in AlGaN/GaN heterojunction field-effect transistors
Toshi-kazu Suzuki, Nariaki Tanaka (JAIST) ED2010-36
(To be available after the conference date) [more] ED2010-36
pp.17-20
ED 2009-06-12
09:55
Tokyo   Anisotropy of two-dimensional electron mobilities in InGaAs/InP
Masashi Akabori (JAIST/Research Centre Juelich), Thanh Quang Trinh, Masahiro Kudo (JAIST), Thomas Schaepers, Hilde Hardtdegen (Research Centre Juelich), Toshi-kazu Suzuki (JAIST) ED2009-45
 [more] ED2009-45
pp.47-50
SDM, ED 2008-07-09
11:15
Hokkaido Kaderu2・7 [Invited Talk] Narrow-gap III-V Semiconductor Technology: Lattice-Mismatched Growth and Epitaxial Lift-off for Heterogeneous Integration
Toshi-kazu Suzuki (JAIST) ED2008-40 SDM2008-59
Narrow-gap III-V semiconductors, such as InAs, InGaAs/InAlAs with high indium compositions, InSb,
and InGaSb/InAlSb, ar... [more]
ED2008-40 SDM2008-59
pp.3-8
ED 2008-06-13
13:00
Ishikawa Kanazawa University Surface passivation of AlGaN/GaN heterojunction field-effect transistors by SiN/AlN bilayer structure
Nariaki Tanaka (JAIST), Yasunobu Sumida, Hiroji Kawai (POWDEC), Toshi-kazu Suzuki (JAIST) ED2008-22
By using AlN single layer, SiN single layer, or SiN/AlN bilayer structure, we have investigated surface passivation of A... [more] ED2008-22
pp.1-4
ED 2008-06-14
10:15
Ishikawa Kanazawa University Heterogeneous integration of InAs thin films by epitaxial lift-off and van der Waals bonding
Hayato Takita, Masahiro Kudo, Nariaki Tanaka, Toshi-kazu Suzuki (JAIST) ED2008-35
We investigated epitaxial lift-off (ELO) of InAs thin films and their van der Waals bonding (VWB) on SiO$_2$/Si substrat... [more] ED2008-35
pp.73-76
ED 2007-06-15
14:25
Toyama Toyama Univ. Epitaxial lift-off of InAs thin films and their van der Waals bonding on SiO2/Si wafers
Hayato Takita, Yonkil Jeong, Jun-ya Arita, Toshi-kazu Suzuki (JAIST) ED2007-34
We investigated epitaxial lift-off (ELO) of InAs thin films using lattice-mismatched InAs top layer/AlAs
sacrificial la... [more]
ED2007-34
pp.17-20
ED 2007-06-16
10:35
Toyama Toyama Univ. Surface passivation of AlGaN/GaN HFETs by RF magnetron sputtering using AlN target
Nariaki Tanaka (JAIST), Yasunobu Sumida (POWDEC), Toshi-kazu Suzuki (JAIST) ED2007-43
We have investigated AlN surface passivation for AlGaN/GaN heterojunction field-effect transistors (HFETs). After the ... [more] ED2007-43
pp.67-70
 Results 1 - 19 of 19  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan