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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 14 of 14  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, RECONF, ICD, IPSJ-SLDM
(Joint) [detail]
2021-12-02
15:35
Online Online Mask Optimization Method Using Simulated Quantum Annealing
Yukihide Kohira, Haruki Nakayama, Naoki Nonaka (Univ. of Aizu), Tomomi Matsui, Atsushi Takahashi (Tokyo Tech), Chikaaki Kodama (KIOXIA Corporation) VLD2021-45 ICD2021-55 DC2021-51 RECONF2021-53
To realize continuously scaling down of technology node, progressing manufacturing process by optical lithography is req... [more] VLD2021-45 ICD2021-55 DC2021-51 RECONF2021-53
pp.162-167
HWS, VLD [detail] 2020-03-04
16:00
Okinawa Okinawa Ken Seinen Kaikan
(Cancelled but technical report was issued)
Pixel-based Mask Optimization with Lagrangian Relaxation and Boundary Flipping
Rina Azuma, Yukihide Kohira (Univ. of Aizu), Tomomi Matsui, Atsushi Takahashi (Tokyo Tech), Chikaaki Kodama (KIOXIA) VLD2019-105 HWS2019-78
Due to miniaturization of process technology, progressing manufacturing process by optical lithography is required. In r... [more] VLD2019-105 HWS2019-78
pp.65-70
VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2019-11-15
16:35
Ehime Ehime Prefecture Gender Equality Center Mask Optimization Considering Process Variation by Subgradient Method
Yukihide Kohira, Rina Azuma (Univ. of Aizu), Tomomi Matsui, Atsushi Takahashi (Tokyo Tech), Chikaaki Kodama (KIOXIA) VLD2019-53 DC2019-77
Due to miniaturization of process technology, progressing manufacturing process by optical lithography is required. In r... [more] VLD2019-53 DC2019-77
pp.197-202
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2018-12-07
14:10
Hiroshima Satellite Campus Hiroshima Process Variation-aware Model-based OPC using 0-1 Quadratic Programming
Rina Azuma, Yukihide Kohira (Univ. of Aizu), Tomomi Matsui, Atsushi Takahashi (Tokyo Tech), Chikaaki Kodama, Shigeki Nojima (TMC) VLD2018-70 DC2018-56
Due to continuous shrinking of Critical Dimensions (CD) of layout pattern in VLSI, advances of manufacturing process in ... [more] VLD2018-70 DC2018-56
pp.209-214
NS, IN
(Joint)
2016-03-04
09:50
Miyazaki Phoenix Seagaia Resort Method for Finding Protected Nodes to Keep Connected Component Size against Crash of Nodes
Tomomi Matsui, Hiroyoshi Miwa (Kwansei Gakuin Univ.) NS2015-214
 [more] NS2015-214
pp.267-272
NS, IN
(Joint)
2015-03-02
09:50
Okinawa Okinawa Convention Center Polynomial-time Approximation Algorithm for Finding Protected Nodes against Crash of Nodes
Tomomi Matsui, Hiroyoshi Miwa (Kwansei Gakuin Univ.) NS2014-186
In recent years, the Internet plays a important role as a social infrastructure. Therefore network service providers are... [more] NS2014-186
pp.59-64
VLD, IPSJ-SLDM 2014-05-29
09:55
Fukuoka Kitakyushu International Conference Center [Invited Talk] Multiple Patterning Lithography by Positive Semidefinite Relaxation
Tomomi Matsui (TITECH) VLD2014-4
(To be available after the conference date) [more] VLD2014-4
p.19
VLD, IPSJ-SLDM 2014-05-29
11:30
Fukuoka Kitakyushu International Conference Center LELECUT Triple Patterning Lithography Layout Decomposition using Positive Semidefinite Relaxation
Yukihide Kohira (Univ. of Aizu), Tomomi Matsui (Tokyo Tech), Yoko Yokoyama, Chikaaki Kodama (Toshiba), Atsushi Takahashi (Tokyo Tech), Shigeki Nojima, Satoshi Tanaka (Toshiba) VLD2014-6
One of the most promising techniques in the 14 nm logic node and beyond is triple patterning lithography (TPL). Recently... [more] VLD2014-6
pp.27-32
NS, IN
(Joint)
2014-03-07
10:40
Miyazaki Miyazaki Seagia Method for Finding Protected Nodes for Network Design Invulnerability against Crash of Some Nodes
Tomomi Matsui, Hiroyoshi Miwa (Kwansei Gakuin Univ.) NS2013-239
The high reliability and performance are needed as the Internet becomes an important social infrastructure. However, in ... [more] NS2013-239
pp.361-366
VLD 2014-03-04
13:50
Okinawa Okinawa Seinen Kaikan Local Pattern Modification Method for Lithographical ECO in Double Patterning
Yutaro Miyabe, Atsushi Takahashi, Tomomi Matsui (Tokyo Inst. of Tech.), Yukihide Kohira (Univ. of Aizu), Yoko Yokoyama (Toshiba) VLD2013-149
In advanced semiconductor manufacturing processes, even though a pattern is generated according to
a design rule, hot s... [more]
VLD2013-149
pp.87-92
NS, IN
(Joint)
2013-03-08
13:20
Okinawa Okinawa Zanpamisaki Royal Hotel Method for Finding Protected Nodes for Invulnerability against Attack to Network Nodes
Tomomi Matsui, Shinya Yamamoto, Hiroyoshi Miwa (Kwansei Gakuin Univ.) NS2012-266
The high reliability and performance are needed as the Internet becomes an important social infrastruc- ture. However, i... [more] NS2012-266
pp.589-594
COMP 2010-06-25
10:05
Tokyo Tokyo Tech Improved Approximation Algorithms for Firefighter Problem on Trees
Yutaka Iwaikawa, Naoyuki Kamiyama, Tomomi Matsui (Chuo Univ.) COMP2010-16
 [more] COMP2010-16
pp.9-12
COMP 2004-10-14
15:45
Miyagi Tohoku University Multicoloring Unit Disk Graphs on Triangular Lattice Points
Yuichiro Miyamoto (Sophia Univ.), Tomomi Matsui (Univ. Tokyo)
In this paper, we discuss a necessary and sufficient condition that the unit disk graph on triangular lattice points is ... [more] COMP2004-41
pp.49-54
COMP 2004-10-14
16:15
Miyagi Tohoku University
Shuji Kijima, Tomomi Matsui (Univ. Tokyo)
In this paper, we propose a perfect (exact) sampler for closed Jackson Networks. Our algorithm is a sampling with Markov... [more] COMP2004-42
pp.55-59
 Results 1 - 14 of 14  /   
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