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Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2019-02-27
10:55
Tokyo Kikai-Shinko-Kaikan Bldg. Efficient Challenge-Response Pairs Generation and Evaluation for PUF Circuit Using BIST Circuit During Manufacturing Test
Tomoki Mino, Shintani Michihiro, Michiko Inoue (NAIST) DC2018-75
Recently, counterfeited ICs have become a big problem for semiconductor supply chains. One of the countermeasures for th... [more] DC2018-75
pp.25-30
NC, MBE
(Joint)
2011-03-08
09:55
Tokyo Tamagawa University Reciprocal Fluctuation in Sensory Evoked Potential for Dermal Electrical Stimulation and it's Modeling
Tomoki Minoda, Ryoko Futami (Fukushima Univ.) MBE2010-115
It is known that character information can be transmitted using Morse code through dermal electrical stimulation by two ... [more] MBE2010-115
pp.69-74
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