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Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2014-06-20
13:40
Tokyo Kikai-Shinko-Kaikan Bldg. A method of LSI degradation estimation using ring oscillators
Tatsunori Ikeda, Yukiya Miura (Tokyo Metropolitan Univ.) DC2014-11
Aging called Negative Bias Temperature Instability (NBTI), Negative Bias Temperature Instability (NBTI) and Chanel Hot C... [more] DC2014-11
pp.7-14
DC 2013-06-21
16:30
Tokyo Kikai-Shinko-Kaikan Bldg. A Method of Transistor Degradation Estimation Using Ring Oscillators
Tatsunori Ikeda, Yukiya Miura (Tokyo Metropolitan Univ.) DC2013-15
Aging called Negative Bias Temperature Instability (NBTI), Negative Bias Temperature Instability (NBTI) and Chanel Hot C... [more] DC2013-15
pp.31-36
 Results 1 - 2 of 2  /   
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