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Committee Date Time Place Paper Title / Authors Abstract Paper #
LQE, LSJ 2016-05-20
09:55
Fukui   Wavelength-dependent photodetection characteristics of APDs fabricated by standard CMOS process
Koichi Iiyama, Zul Atfyi Fauzan bin Mohammed Napiah, Takuya Hishiiki (Kanazawa Univ.) LQE2016-9
Avalanche photodiodes fabricated by standard CMOS process (CMOS-APD) have features of high avalanche gain less than 10,V... [more] LQE2016-9
pp.37-41
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