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Committee Date Time Place Paper Title / Authors Abstract Paper #
RCC, MICT 2015-05-28
15:20		 Tokyo Kikai-Shinko-Kaikan Bldg Rapid Recovery Technique from Soft Error of FPGAs in Information and Communication Apparatus
Kenichi Shimbo, Tadanobu Toba, Takumi Uezono, Hidefumi Ibe (Hitachi) RCC2015-9 MICT2015-9		 As the amount of data traffic through the communication infrastructure is increasing, a development of high-speed inform... [more] RCC2015-9 MICT2015-9
pp.37-42
VLD 2010-09-28
14:35		 Kyoto Kyoto Institute of Technology A study of temperature characteristics of ring-oscillator based threshold voltage estimation
Takumi Uezono, Hiroyuki Ochi, Takashi Sato (Kyoto Univ.) VLD2010-53		 Yield and reliability improvement is one of the most serious concerns for nanometer-technology chip designs. Recenly, s... [more] VLD2010-53
pp.67-70
VLD, IPSJ-SLDM 2009-05-21
10:25		 Fukuoka Kitakyushu International Conference Center Importance sampling with two-phase preprocess considering structural symmetry of SRAM circuits
Takanori Date, Shiho Hagiwara, Takumi Uezono (Tokyo Inst. of Tech.), Takashi Sato (Kyoto Univ.), Kazuya Masu (Tokyo Inst. of Tech.) VLD2009-5		 The influence of process variation on SRAM yield has become a serious consern in scaled technologies.
Monte Carlo-based... [more]		 VLD2009-5
pp.37-42
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